Modeling of conductor loss in coplanar circuit elements by the method of lines

The small dimensions of coplanar waveguides (CPW's) require due consideration of finite conductivity and metallization thickness. For this purpose, an efficient method of lines (MoL) approach for full-wave analysis of microstrip discontinuities is considerably extended. Two alternative models f...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on microwave theory and techniques 1997-12, Vol.45 (12), p.2474-2478
Main Authors: Vietzorreck, L., Pascher, W.
Format: Article
Language:English
Subjects:
Boundary conditions
Circuits
Conductivity
Conductors
Coplanar waveguides
Metallization
Microstrip
Skin
Strips
Transmission line discontinuities
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The small dimensions of coplanar waveguides (CPW's) require due consideration of finite conductivity and metallization thickness. For this purpose, an efficient method of lines (MoL) approach for full-wave analysis of microstrip discontinuities is considerably extended. Two alternative models for the conductor loss are employed depending on the skin depth. Their respective region of validity is investigated and the current distribution in the center conductor of a CPW is given. Several cascaded discontinuities including a coplanar quarter-wave transformer and a short-end series stub in a microshield line are characterized.
ISSN:0018-9480
1557-9670
DOI:10.1109/22.643862