Specification for a standard procedure of X-ray diffraction measurements on carbon materials

In 1963, the 117 Committee of the Japan Society for the Promotion of Sciences (JSPS) specified standard procedures for the determination of lattice constants and crystallite sizes of carbon materials, especially graphitized materials, the so-called “Gakushin” method. In 2002 the 117 Committee starte...

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Bibliographic Details
Published in:Carbon (New York) 2004, Vol.42 (4), p.701-714
Main Authors: Iwashita, Norio, Park, Chong Rae, Fujimoto, Hiroyuki, Shiraishi, Minoru, Inagaki, Michio
Format: Article
Language:English
Subjects:
B: Graphitization
C: X-ray diffraction
Cross-disciplinary physics: materials science
rheology
D: Crystal structure
Exact sciences and technology
Fullerenes and related materials
diamonds, graphite
Materials science
Physics
Specific materials
Citations: Items that cite this one
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Summary:In 1963, the 117 Committee of the Japan Society for the Promotion of Sciences (JSPS) specified standard procedures for the determination of lattice constants and crystallite sizes of carbon materials, especially graphitized materials, the so-called “Gakushin” method. In 2002 the 117 Committee started to discuss the revision of the specification in order to accept some modern computing processes, such as automatic step-scanning measurements of diffraction intensities, profile fitting for diffraction lines, etc. In this paper, the English version of the revised specification is presented to the international community of scientists working on carbon materials, and to solicit comments.
ISSN:0008-6223
1873-3891
DOI:10.1016/j.carbon.2004.02.008