Recent progress in energy-filtered high energy X-ray photoemission electron microscopy using a Wien filter type energy analyzer

Energy-filtered X-ray photoemission electron microscopy (EXPEEM) is a microscopy technique which has the potential to provide surface chemical mapping during surface chemical processes on the nanometer scale. We studied the possibilities of EXPEEM using a Wien filter type energy analyzer in the high...

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Bibliographic Details
Published in:Applied surface science 2004-10, Vol.237 (1-4), p.637-640
Main Authors: Niimi, H., Tsutsumi, T., Matsudaira, H., Kawasaki, T., Suzuki, S., Chun, W.-J., Kato, M., Kitajima, Y., Iwasawa, Y., Asakura, K.
Format: Article
Language:English
Subjects:
Applied sciences
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Condensed matter: structure, mechanical and thermal properties
Electron and ion emission by liquids and solids
impact phenomena
Electron, ion, and scanning probe microscopy
Exact sciences and technology
EXPEEM
Metals. Metallurgy
PEEM
Photoemission and photoelectron spectra
Photoemission electron microscopy
Physics
Scanning auger microscopy, photoelectron microscopy
Spectromicroscopy
Structure of solids and liquids
crystallography
Wien filter
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Summary:Energy-filtered X-ray photoemission electron microscopy (EXPEEM) is a microscopy technique which has the potential to provide surface chemical mapping during surface chemical processes on the nanometer scale. We studied the possibilities of EXPEEM using a Wien filter type energy analyzer in the high energy X-ray region above 1000eV. We have successfully observed the EXPEEM images of Au islands on a Ta sheet using Au 3d5/2 and Ta 3d5/2 photoelectron peaks which were excited by 2380eV X-rays emitted from an undulator (BL2A) at Photon Factory. Our recent efforts to improve the sensitivity of the Wien filter energy analyzer will also be discussed.
ISSN:0169-4332
1873-5584
DOI:10.1016/j.apsusc.2004.06.112