Measurements of Microwave Conductivity and Dielectric Constant by the Cavity Perturbation Method and Their Errors

The theory and technique of the cavity perturbation method for measuring the conductivity and dielectric constant of materials are reviewed. An analytical formula for calculating the errors of the conductivity and dielectric constant caused by the measured error in the resonant frequency and quality...

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Bibliographic Details
Published in:IEEE transactions on microwave theory and techniques 1985-06, Vol.33 (6), p.519-526
Main Author: Chao, S
Format: Article
Language:English
Subjects:
Cavity perturbation methods
Conducting materials
Conductivity measurement
Dielectric constant
Dielectric materials
Dielectric measurements
Electrical and electronic components, instruments and techniques
Exact sciences and technology
Frequency measurement
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Microwave measurements
Microwave theory and techniques
Physics
Resonant frequency
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Summary:The theory and technique of the cavity perturbation method for measuring the conductivity and dielectric constant of materials are reviewed. An analytical formula for calculating the errors of the conductivity and dielectric constant caused by the measured error in the resonant frequency and quality factor are derived. This formula can be used for both rectangular and cylindrical cavities. The results of measurements on silicon samples are presented to illustrate this analysis.
ISSN:0018-9480
1557-9670
DOI:10.1109/TMTT.1985.1133108