Magnetic field behavior of SNS edge Josephson junctions

Measurements of the response of critical current of YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta///PrBa/sub 2/Cu/sub (3-x)/(Ga)/sub x/O/sub 7-/spl delta///YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// SNS edge Josephson junctions to external magnetic field reveal periodic dependence of critical current on magnet...

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Bibliographic Details
Published in:IEEE transactions on applied superconductivity 1999-06, Vol.9 (2), p.3149-3152
Main Author: Bulman, J.B.
Format: Article
Language:English
Subjects:
Applied sciences
COPPER OXIDE
Critical current
Critical current (superconductivity)
Current measurement
Curvature
Diffraction
Diffraction patterns
Electronics
Exact sciences and technology
Josephson junctions
Magnetic analysis
MAGNETIC FIELD
Magnetic field measurement
Magnetic fields
MATHEMATICAL ANALYSIS
Modulation
Pattern analysis
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Shape
Superconducting devices
SUPERCONDUCTIVITY
Temperature
YTTRIUM OXIDE
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Summary:Measurements of the response of critical current of YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta///PrBa/sub 2/Cu/sub (3-x)/(Ga)/sub x/O/sub 7-/spl delta///YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// SNS edge Josephson junctions to external magnetic field reveal periodic dependence of critical current on magnetic field. Theoretically the shape of critical current versus magnetic field for uniform current flow across the junction should resemble a Fraunhofer diffraction pattern. Using analysis of depth of modulation as an indication of how well the experimental modulation pattern fits the diffraction model, our experiments show a correlation between the depth of modulation and the type of junction. RSJ-like I-V curves, with their sharp concave upward curvature and I/sub ex//I/sub c/1. Also the response of single junctions as a function of temperature is analyzed.
ISSN:1051-8223
1558-2515
DOI:10.1109/77.783697