Nonlinear yield analysis and optimization of monolithic microwave integrated circuits

In this paper, a discussion about nonlinear yield evaluation and nonlinear yield optimization of MMIC circuits using a physics-based nonlinear lumped-element MESFET model is presented. The lumped elements of the MESFET model are directly calculated by closed expressions related to process parameters...

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Bibliographic Details
Published in:IEEE transactions on microwave theory and techniques 1995-10, Vol.43 (10), p.2504-2507
Main Authors: D'Agostino, S., Paoloni, C.
Format: Article
Language:English
Subjects:
Dielectric substrates
Integrated circuit modeling
Integrated circuit yield
MESFET circuits
MESFET integrated circuits
Microwave integrated circuits
MMICs
Monolithic integrated circuits
Performance analysis
Semiconductor process modeling
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Summary:In this paper, a discussion about nonlinear yield evaluation and nonlinear yield optimization of MMIC circuits using a physics-based nonlinear lumped-element MESFET model is presented. The lumped elements of the MESFET model are directly calculated by closed expressions related to process parameters. One of the main features of the model is the easy and effective implementation in commercial CAD tools. It allows the use of nonlinear yield algorithms assuming, as statistical variables, the parameters of the technological process, such as: doping density, gate channel length, etc., maintaining at the same time, the advantages of lumped-element MESFET model, in particular fast computation and reduction of convergence problems in harmonic balance for complex circuit topologies.< >
ISSN:0018-9480
1557-9670
DOI:10.1109/22.466189