THERMALLY ACTIVATED DIFFUSION OBSERVED BY IN SITU REFLECTION HIGH ENERGY ELECTRON DIFFRACTION INTENSITY MONITORING ON INTERRUPTED SrTiO3 HOMOEPITAXIAL GROWTH

RHEED intensity is reported following a quadratic power law dependence on annealing time for interrupted laser ablation-grown strontium titanate films. The activation energy of 1.0 eV can further be obtained from the diffusion Arrhenius plot by assuming a direct proportionality between the RHEED int...

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Published in:Jpn.J.Appl.Phys ,Part 1. Vol. 43, no. 2, pp. 771-772. 2004 Part 1. Vol. 43, no. 2, pp. 771-772. 2004, 2004, Vol.43 (2), p.771-772
Main Authors: Wang, T-C, Juang, J-Y, Wu, K-H, Uen, T-M, Gou, Y-S
Format: Article
Language:English
Online Access:Get full text
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Summary:RHEED intensity is reported following a quadratic power law dependence on annealing time for interrupted laser ablation-grown strontium titanate films. The activation energy of 1.0 eV can further be obtained from the diffusion Arrhenius plot by assuming a direct proportionality between the RHEED intensity and the diffusion length. 7 refs.
ISSN:0021-4922
DOI:10.1143/JJAP.43.771