A new global finite element analysis of microwave circuits including lumped elements

A new fullwave global analysis of complex inhomogeneous microwave structures including passive or active, linear or nonlinear lumped elements is presented. For a given structure, only one electromagnetic simulation of the distributed part, by a three-dimensional (3-D) finite element method using edg...

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Bibliographic Details
Published in:IEEE transactions on microwave theory and techniques 1996-12, Vol.44 (12), p.2587-2594
Main Authors: Guillouard, K., Man-Fai Wong, Hanna, V.F., Citerne, J.
Format: Article
Language:English
Subjects:
Analytical models
Circuit analysis
Circuit simulation
Circuit testing
Diodes
Finite element methods
Microwave circuits
Resistors
Software measurement
Software testing
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Summary:A new fullwave global analysis of complex inhomogeneous microwave structures including passive or active, linear or nonlinear lumped elements is presented. For a given structure, only one electromagnetic simulation of the distributed part, by a three-dimensional (3-D) finite element method using edge elements, is needed corresponding to the insertion of variable lumped elements placed at the same position. Simulation results of various test cases, containing either resistor, diode, or active component, are compared with those provided by a commercial circuit analysis software or with measurements results. Our validated electromagnetic simulator is then used for analyzing a planar balanced mixer operating in the millimetric range.
ISSN:0018-9480
1557-9670
DOI:10.1109/22.554608