Phase noise characterization of SAW oscillators based on a Newton minimization procedure

• Published in: IEEE transactions on microwave theory and techniques 1991-05, Vol.39 (5), p.883-889
• Main Authors: Klemer, D.P., Shih, K.-M., Clark, E.E.
• Format: Article
• Language: English
• Subjects: 1f noise; Acoustic wave devices, piezoelectric and piezoresistive devices; Applied sciences; Circuits; Electronics; Exact sciences and technology; Frequency; Minimization; Noise measurement; Phase measurement; Phase noise; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Surface acoustic wave devices; Surface acoustic waves; Voltage-controlled oscillators
• ISSN: 0018-9480; 1557-9670
• DOI: 10.1109/22.79117

An iterative minimization technique is used to optimize the values of circuit and device parameters which determine the phase noise response of a voltage-controlled SAW-stabilized oscillator (VCSO). An expression-developed by T.E. Parker (1985) is used to calculate the double-sideband phase noise to carrier ratio from circuit parameter values; good agreement between calculations and phase noise measurements is achieved by minimizing the squared error through the use of a steepest-descent/Newton-Raphson minimization scheme. Less accurately known circuit parameters are thus optimized in an iterative fashion. Exact expressions for the elements of the Hessian Matrix are used in the Newton-Raphson procedure, allowing for fast computations. The numerical findings suggest that useful results can be obtained in the determination of VCSO circuit parameters.< >