Development of photoelectron spectro-holography apparatus

We improved the photoelectron spectro‐holography apparatus for high‐speed and high‐energy photoelectron detection. The combination of an aperture for ±1.4° acceptance angle at the diffraction plane and a 64‐channel detector realized the high‐speed XPS and rapid x‐ray photoelectron diffraction (XPED)...

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Bibliographic Details
Published in:Surface and interface analysis 2005-02, Vol.37 (2), p.211-216
Main Authors: Ishii, Hideshi, Mamaishin, Shuichi, Tamura, Keiji, Chu, Wei-Guo, Owari, Masanori, Doi, Makoto, Tsukamoto, Katsumi, Takahashi, Sadayuki, Iwai, Hideo, Watanabe, Katsumi, Kobayashi, Hideo, Kita, Yoshiteru, Yamazui, Hiromichi, Taguchi, Masami, Shimizu, Ryuichi, Nihei, Yoshimasa
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Cu Kα
Exact sciences and technology
high-energy photoelectron
high-speed detection
instrumentation
Physics
rapid measurement
SrTiO3
x-ray photoelectron diffraction
x-ray photoelectron holography
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Summary:We improved the photoelectron spectro‐holography apparatus for high‐speed and high‐energy photoelectron detection. The combination of an aperture for ±1.4° acceptance angle at the diffraction plane and a 64‐channel detector realized the high‐speed XPS and rapid x‐ray photoelectron diffraction (XPED) measurements Furthermore, high‐energy XPS and XPED measurements excited by Cu Kα have been performed. Copyright © 2005 John Wiley & Sons, Ltd.
ISSN:0142-2421
1096-9918
DOI:10.1002/sia.1967