Optimized test application timing for AC test

The problems associated with optimization of the test application timing for a class of test equipment are identified. Two approaches to test application timing are introduced. The notion of slack is used to define the objective function for optimization. The optimization problem is shown to be NP-c...

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Bibliographic Details
Published in:IEEE transactions on computer-aided design of integrated circuits and systems 1992-11, Vol.11 (11), p.1439-1449
Main Authors: Iyengar, V.S., Vijayan, G.
Format: Article
Language:English
Subjects:
Applied sciences
Assembly
Circuit faults
Circuit simulation
Circuit testing
Delay
Design. Technologies. Operation analysis. Testing
Electronics
Exact sciences and technology
Integrated circuit technology
Integrated circuit testing
Integrated circuits
Logic testing
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Test equipment
Timing
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Summary:The problems associated with optimization of the test application timing for a class of test equipment are identified. Two approaches to test application timing are introduced. The notion of slack is used to define the objective function for optimization. The optimization problem is shown to be NP-complete even for nonreconvergent-fanout circuits. Heuristics for the optimization problems are presented, and the results are compared with bounds on test circuits.< >
ISSN:0278-0070
1937-4151
DOI:10.1109/43.177406