Mode I fatigue crack growth under biaxial loading

• Published in: International journal of fatigue 2005-10, Vol.27 (10-12), p.1342-1346
• Main Authors: Hamam, R, Pommier, S, Bumbieler, F
• Format: Article
• Language: English
• ISSN: 0142-1123
• DOI: 10.1016/ijfatigue.2005.06.020

This paper is centred on the role of the T-stress during mode I fatigue crack growth. The effect of a T-stress is studied through its effect on plastic blunting at crack tip. As a matter of fact, fatigue crack growth is characterized by the presence of striations on the fracture surface, which implies that the crack grows by a mechanism of plastic blunting and re-sharpening. In the present study, plastic blunting at crack tip is a global variable rho, which is calculated using the finite element method. rho is defined as the average value of the permanent displacement of the crack faces over the whole K-dominance area. The presence of a T-stress modifies significantly the evolution of plastic deformation within the crack tip plastic zone as a consequence of plastic blunting at crack tip. A yield stress intensity factor Ky is defined for the cracked structure, as the stress intensity factor for which plastic blunting at crack tip exceeds a given value. The variation of the yield stress intensity factor was studied as a function of the T-stress. It is found that the T-stress modifies significantly the yield point of the cracked structure and that the yield surface in a (T, KI) plane is independent of the crack length. Finally, a yield criterion is proposed for the cracked structure. This criterion is an extent of the Von-Mises yield criterion to the problem of the cracked structure. The proposed criterion matches almost perfectly the results obtained from the FEM. The evolution of the yield surface of the cracked structure in a (T, KI) plane was also studied for a few loading schemes. These results should develop a plasticity model for the cracked structure taking into account the effect of the T-stress.