Quantitative surface analysis of plastic deformation of Pd electrodes in nanoscale

Small-angle X-ray scattering (SAXS) was employed as a powerful technique for quantitative surface analysis of Pd electrodes subjected to severe plastic deformation. The experimental data obtained from SAXS measurements were analyzed by means of fractal geometry, as so-called fractal dimensions can b...

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Bibliographic Details
Published in:Applied surface science 2005-03, Vol.242 (1), p.82-87
Main Authors: Eftekhari, Ali, Kazemzad, Mahmood, Keyanpour-Rad, Mansoor, Bahrevar, Mohammad Ali
Format: Article
Language:English
Subjects:
Applied sciences
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Fractal
Interface structure and roughness
Mechanical and acoustical properties
adhesion
Metals. Metallurgy
Nanoscale roughness
Nanostructure
Pd electrode
Physics
Plastic deformation
SAXS
Solid surfaces and solid-solid interfaces
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
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Summary:Small-angle X-ray scattering (SAXS) was employed as a powerful technique for quantitative surface analysis of Pd electrodes subjected to severe plastic deformation. The experimental data obtained from SAXS measurements were analyzed by means of fractal geometry, as so-called fractal dimensions can be used as a quantitative measure of surface roughness. The influence of the strength of plastic deformation induced to the Pd/H system (due to phase transformation) on the degree of surface roughness was inspected. The powerfulness of this approach is ability for inspecting surface roughness in nanoscale. The surface fractality at nanoscale is significantly different from that at microscale.
ISSN:0169-4332
1873-5584
DOI:10.1016/j.apsusc.2004.07.065