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Quantitative surface analysis of plastic deformation of Pd electrodes in nanoscale
Small-angle X-ray scattering (SAXS) was employed as a powerful technique for quantitative surface analysis of Pd electrodes subjected to severe plastic deformation. The experimental data obtained from SAXS measurements were analyzed by means of fractal geometry, as so-called fractal dimensions can b...
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| Published in: | Applied surface science 2005-03, Vol.242 (1), p.82-87 |
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| Main Authors: | , , , |
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| Language: | English |
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| cites | cdi_FETCH-LOGICAL-c367t-872025daafa415c908396d50a81e75b0da51df7c1c2684ccdd498699a7fee6cb3 |
| container_end_page | 87 |
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| container_start_page | 82 |
| container_title | Applied surface science |
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| creator | Eftekhari, Ali Kazemzad, Mahmood Keyanpour-Rad, Mansoor Bahrevar, Mohammad Ali |
| description | Small-angle X-ray scattering (SAXS) was employed as a powerful technique for quantitative surface analysis of Pd electrodes subjected to severe plastic deformation. The experimental data obtained from SAXS measurements were analyzed by means of fractal geometry, as so-called fractal dimensions can be used as a quantitative measure of surface roughness. The influence of the strength of plastic deformation induced to the Pd/H system (due to phase transformation) on the degree of surface roughness was inspected. The powerfulness of this approach is ability for inspecting surface roughness in nanoscale. The surface fractality at nanoscale is significantly different from that at microscale. |
| doi_str_mv | 10.1016/j.apsusc.2004.07.065 |
| format | article |
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The experimental data obtained from SAXS measurements were analyzed by means of fractal geometry, as so-called fractal dimensions can be used as a quantitative measure of surface roughness. The influence of the strength of plastic deformation induced to the Pd/H system (due to phase transformation) on the degree of surface roughness was inspected. The powerfulness of this approach is ability for inspecting surface roughness in nanoscale. The surface fractality at nanoscale is significantly different from that at microscale.</description><identifier>ISSN: 0169-4332</identifier><identifier>EISSN: 1873-5584</identifier><identifier>DOI: 10.1016/j.apsusc.2004.07.065</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Applied sciences ; Condensed matter: structure, mechanical and thermal properties ; Exact sciences and technology ; Fractal ; Interface structure and roughness ; Mechanical and acoustical properties; adhesion ; Metals. 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Metallurgy</subject><subject>Nanoscale roughness</subject><subject>Nanostructure</subject><subject>Pd electrode</subject><subject>Physics</subject><subject>Plastic deformation</subject><subject>SAXS</subject><subject>Solid surfaces and solid-solid interfaces</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><issn>0169-4332</issn><issn>1873-5584</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNp9kE1LJDEQhoMoOH78Aw99cW_dJt2d_rgsLOKuguAHeg5lpQIZepLZVLfgvzfDCN48BSrP-xb1CHGhZKWk6q7WFWx5YaxqKdtK9pXs9IFYqaFvSq2H9lCsMjaWbdPUx-KEeS2lqvPvSjw_LRBmP8Ps36ngJTlAKiDA9MGei-iK7QQ8eywsuZg2mYthN360BU2Ec4qWuPChCBAiI0x0Jo4cTEznX--peP1783J9W94__Lu7_nNfYtP1czn0tay1BXDQKo2jHJqxs1rCoKjXb9KCVtb1qLDuhhbR2nYcunGE3hF1-Nacil_73m2K_xfi2Ww8I00TBIoLm3rQOSjrDLZ7EFNkTuTMNvkNpA-jpNkJNGuzF2h2Ao3sTRaYY5df_bC7yyUI6Pk72-V63arM_d5zlI9995QMo6eAZH3KgoyN_udFn38DieI</recordid><startdate>20050331</startdate><enddate>20050331</enddate><creator>Eftekhari, Ali</creator><creator>Kazemzad, Mahmood</creator><creator>Keyanpour-Rad, Mansoor</creator><creator>Bahrevar, Mohammad Ali</creator><general>Elsevier B.V</general><general>Elsevier Science</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20050331</creationdate><title>Quantitative surface analysis of plastic deformation of Pd electrodes in nanoscale</title><author>Eftekhari, Ali ; Kazemzad, Mahmood ; Keyanpour-Rad, Mansoor ; Bahrevar, Mohammad Ali</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c367t-872025daafa415c908396d50a81e75b0da51df7c1c2684ccdd498699a7fee6cb3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Applied sciences</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Exact sciences and technology</topic><topic>Fractal</topic><topic>Interface structure and roughness</topic><topic>Mechanical and acoustical properties; adhesion</topic><topic>Metals. 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| ispartof | Applied surface science, 2005-03, Vol.242 (1), p.82-87 |
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| language | eng |
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| source | Elsevier |
| subjects | Applied sciences Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Fractal Interface structure and roughness Mechanical and acoustical properties adhesion Metals. Metallurgy Nanoscale roughness Nanostructure Pd electrode Physics Plastic deformation SAXS Solid surfaces and solid-solid interfaces Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) |
| title | Quantitative surface analysis of plastic deformation of Pd electrodes in nanoscale |
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