Rapid turn-on of shelf-stored tubes: an update

The authors discuss the poisoning during shelf storage, of cathode surfaces as a result of adsorption of ambient gas residuals. The magnitude of the poisoning depends on the type of cathode and residual gas and follows the same order in which these different cathodes adsorbed the various ambient gas...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on electron devices 1991-10, Vol.38 (10), p.2244-2251
Main Authors: Haas, G.A., Thomas, R.E., Marrian, C.R.K., Shih, A.
Format: Article
Language:English
Subjects:
Applied sciences
Bonding
Cathodes
Electronic tubes, masers
Electronics
Electrons
Exact sciences and technology
Gases
Heating
Modems
Surface finishing
Surface topography
Temperature
Toxicology
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c334t-b2d376667cc588d6b8cc9587ed1838d113f45fbc439f4d7e977bdccb0fb22c393
cites cdi_FETCH-LOGICAL-c334t-b2d376667cc588d6b8cc9587ed1838d113f45fbc439f4d7e977bdccb0fb22c393
container_end_page 2251
container_issue 10
container_start_page 2244
container_title IEEE transactions on electron devices
container_volume 38
creator Haas, G.A.
Thomas, R.E.
Marrian, C.R.K.
Shih, A.
description The authors discuss the poisoning during shelf storage, of cathode surfaces as a result of adsorption of ambient gas residuals. The magnitude of the poisoning depends on the type of cathode and residual gas and follows the same order in which these different cathodes adsorbed the various ambient gases (i.e. sticking coefficients). Turn-on consists of several simultaneous processes. These involve the desorption of the poisoning compounds and the regeneration of a new Ba-O surface via the impregnant within the cathode matrix. The effects which various factors have on the reactivation time are also discussed. These include different exposures to poisoning gases, heating time and temperature, Ba impregnant concentration, Ba-O bonding, cathode types, surface composition and pore spacing. In addition, from analysis of low-energy interatomic and valence Auger data, the surface configurations were determined during various stages of poisoning and activation.< >
doi_str_mv 10.1109/16.88506
format article
fullrecord <record><control><sourceid>proquest_ieee_</sourceid><recordid>TN_cdi_proquest_miscellaneous_28580973</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>88506</ieee_id><sourcerecordid>28580973</sourcerecordid><originalsourceid>FETCH-LOGICAL-c334t-b2d376667cc588d6b8cc9587ed1838d113f45fbc439f4d7e977bdccb0fb22c393</originalsourceid><addsrcrecordid>eNqF0E1LxDAQBuAgCq6r4NVbDyJesibNtzdZ_IIFQfQc0mSClW5bk_bgv7faZa-ehpl5eA8vQueUrCgl5obKldaCyAO0oEIobCSXh2hBCNXYMM2O0UnOn9MqOS8XaPXq-joUw5ha3LVFF4v8AU3EeegS_N4ryLeFa4uxD26AU3QUXZPhbDeX6P3h_m39hDcvj8_ruw32jPEBV2VgSkqpvBdaB1lp743QCgLVTAdKWeQiVp4zE3lQYJSqgvcViVVZembYEl3NuX3qvkbIg93W2UPTuBa6MdtSC02MYv9DwYlhhk7weoY-dTkniLZP9dalb0uJ_W3OUmn_mpvo5S7TZe-amFzr67z33EhJmZjYxcxqANh_54gfNQBzXg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>25409391</pqid></control><display><type>article</type><title>Rapid turn-on of shelf-stored tubes: an update</title><source>IEEE Xplore (Online service)</source><creator>Haas, G.A. ; Thomas, R.E. ; Marrian, C.R.K. ; Shih, A.</creator><creatorcontrib>Haas, G.A. ; Thomas, R.E. ; Marrian, C.R.K. ; Shih, A.</creatorcontrib><description>The authors discuss the poisoning during shelf storage, of cathode surfaces as a result of adsorption of ambient gas residuals. The magnitude of the poisoning depends on the type of cathode and residual gas and follows the same order in which these different cathodes adsorbed the various ambient gases (i.e. sticking coefficients). Turn-on consists of several simultaneous processes. These involve the desorption of the poisoning compounds and the regeneration of a new Ba-O surface via the impregnant within the cathode matrix. The effects which various factors have on the reactivation time are also discussed. These include different exposures to poisoning gases, heating time and temperature, Ba impregnant concentration, Ba-O bonding, cathode types, surface composition and pore spacing. In addition, from analysis of low-energy interatomic and valence Auger data, the surface configurations were determined during various stages of poisoning and activation.&lt; &gt;</description><identifier>ISSN: 0018-9383</identifier><identifier>EISSN: 1557-9646</identifier><identifier>DOI: 10.1109/16.88506</identifier><identifier>CODEN: IETDAI</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Bonding ; Cathodes ; Electronic tubes, masers ; Electronics ; Electrons ; Exact sciences and technology ; Gases ; Heating ; Modems ; Surface finishing ; Surface topography ; Temperature ; Toxicology</subject><ispartof>IEEE transactions on electron devices, 1991-10, Vol.38 (10), p.2244-2251</ispartof><rights>1992 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c334t-b2d376667cc588d6b8cc9587ed1838d113f45fbc439f4d7e977bdccb0fb22c393</citedby><cites>FETCH-LOGICAL-c334t-b2d376667cc588d6b8cc9587ed1838d113f45fbc439f4d7e977bdccb0fb22c393</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/88506$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,54796</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=4966135$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Haas, G.A.</creatorcontrib><creatorcontrib>Thomas, R.E.</creatorcontrib><creatorcontrib>Marrian, C.R.K.</creatorcontrib><creatorcontrib>Shih, A.</creatorcontrib><title>Rapid turn-on of shelf-stored tubes: an update</title><title>IEEE transactions on electron devices</title><addtitle>TED</addtitle><description>The authors discuss the poisoning during shelf storage, of cathode surfaces as a result of adsorption of ambient gas residuals. The magnitude of the poisoning depends on the type of cathode and residual gas and follows the same order in which these different cathodes adsorbed the various ambient gases (i.e. sticking coefficients). Turn-on consists of several simultaneous processes. These involve the desorption of the poisoning compounds and the regeneration of a new Ba-O surface via the impregnant within the cathode matrix. The effects which various factors have on the reactivation time are also discussed. These include different exposures to poisoning gases, heating time and temperature, Ba impregnant concentration, Ba-O bonding, cathode types, surface composition and pore spacing. In addition, from analysis of low-energy interatomic and valence Auger data, the surface configurations were determined during various stages of poisoning and activation.&lt; &gt;</description><subject>Applied sciences</subject><subject>Bonding</subject><subject>Cathodes</subject><subject>Electronic tubes, masers</subject><subject>Electronics</subject><subject>Electrons</subject><subject>Exact sciences and technology</subject><subject>Gases</subject><subject>Heating</subject><subject>Modems</subject><subject>Surface finishing</subject><subject>Surface topography</subject><subject>Temperature</subject><subject>Toxicology</subject><issn>0018-9383</issn><issn>1557-9646</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1991</creationdate><recordtype>article</recordtype><recordid>eNqF0E1LxDAQBuAgCq6r4NVbDyJesibNtzdZ_IIFQfQc0mSClW5bk_bgv7faZa-ehpl5eA8vQueUrCgl5obKldaCyAO0oEIobCSXh2hBCNXYMM2O0UnOn9MqOS8XaPXq-joUw5ha3LVFF4v8AU3EeegS_N4ryLeFa4uxD26AU3QUXZPhbDeX6P3h_m39hDcvj8_ruw32jPEBV2VgSkqpvBdaB1lp743QCgLVTAdKWeQiVp4zE3lQYJSqgvcViVVZembYEl3NuX3qvkbIg93W2UPTuBa6MdtSC02MYv9DwYlhhk7weoY-dTkniLZP9dalb0uJ_W3OUmn_mpvo5S7TZe-amFzr67z33EhJmZjYxcxqANh_54gfNQBzXg</recordid><startdate>19911001</startdate><enddate>19911001</enddate><creator>Haas, G.A.</creator><creator>Thomas, R.E.</creator><creator>Marrian, C.R.K.</creator><creator>Shih, A.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>7SP</scope></search><sort><creationdate>19911001</creationdate><title>Rapid turn-on of shelf-stored tubes: an update</title><author>Haas, G.A. ; Thomas, R.E. ; Marrian, C.R.K. ; Shih, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c334t-b2d376667cc588d6b8cc9587ed1838d113f45fbc439f4d7e977bdccb0fb22c393</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1991</creationdate><topic>Applied sciences</topic><topic>Bonding</topic><topic>Cathodes</topic><topic>Electronic tubes, masers</topic><topic>Electronics</topic><topic>Electrons</topic><topic>Exact sciences and technology</topic><topic>Gases</topic><topic>Heating</topic><topic>Modems</topic><topic>Surface finishing</topic><topic>Surface topography</topic><topic>Temperature</topic><topic>Toxicology</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Haas, G.A.</creatorcontrib><creatorcontrib>Thomas, R.E.</creatorcontrib><creatorcontrib>Marrian, C.R.K.</creatorcontrib><creatorcontrib>Shih, A.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Electronics &amp; Communications Abstracts</collection><jtitle>IEEE transactions on electron devices</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Haas, G.A.</au><au>Thomas, R.E.</au><au>Marrian, C.R.K.</au><au>Shih, A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Rapid turn-on of shelf-stored tubes: an update</atitle><jtitle>IEEE transactions on electron devices</jtitle><stitle>TED</stitle><date>1991-10-01</date><risdate>1991</risdate><volume>38</volume><issue>10</issue><spage>2244</spage><epage>2251</epage><pages>2244-2251</pages><issn>0018-9383</issn><eissn>1557-9646</eissn><coden>IETDAI</coden><abstract>The authors discuss the poisoning during shelf storage, of cathode surfaces as a result of adsorption of ambient gas residuals. The magnitude of the poisoning depends on the type of cathode and residual gas and follows the same order in which these different cathodes adsorbed the various ambient gases (i.e. sticking coefficients). Turn-on consists of several simultaneous processes. These involve the desorption of the poisoning compounds and the regeneration of a new Ba-O surface via the impregnant within the cathode matrix. The effects which various factors have on the reactivation time are also discussed. These include different exposures to poisoning gases, heating time and temperature, Ba impregnant concentration, Ba-O bonding, cathode types, surface composition and pore spacing. In addition, from analysis of low-energy interatomic and valence Auger data, the surface configurations were determined during various stages of poisoning and activation.&lt; &gt;</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/16.88506</doi><tpages>8</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0018-9383
ispartof IEEE transactions on electron devices, 1991-10, Vol.38 (10), p.2244-2251
issn 0018-9383
1557-9646
language eng
recordid cdi_proquest_miscellaneous_28580973
source IEEE Xplore (Online service)
subjects Applied sciences
Bonding
Cathodes
Electronic tubes, masers
Electronics
Electrons
Exact sciences and technology
Gases
Heating
Modems
Surface finishing
Surface topography
Temperature
Toxicology
title Rapid turn-on of shelf-stored tubes: an update
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-21T02%3A15%3A07IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_ieee_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Rapid%20turn-on%20of%20shelf-stored%20tubes:%20an%20update&rft.jtitle=IEEE%20transactions%20on%20electron%20devices&rft.au=Haas,%20G.A.&rft.date=1991-10-01&rft.volume=38&rft.issue=10&rft.spage=2244&rft.epage=2251&rft.pages=2244-2251&rft.issn=0018-9383&rft.eissn=1557-9646&rft.coden=IETDAI&rft_id=info:doi/10.1109/16.88506&rft_dat=%3Cproquest_ieee_%3E28580973%3C/proquest_ieee_%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c334t-b2d376667cc588d6b8cc9587ed1838d113f45fbc439f4d7e977bdccb0fb22c393%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=25409391&rft_id=info:pmid/&rft_ieee_id=88506&rfr_iscdi=true