Signal resolution of RSFQ comparators

We have designed and tested a Rapid Single-Flux-Quantum (RSFQ) circuit for experimental measurement of the fluctuation-induced threshold uncertainty of switching of SFQ comparators, which are essential components of RSFQ logic devices, analog-to-digital converters, and digital SQUIDs. Statistical de...

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Bibliographic Details
Published in:IEEE transactions on applied superconductivity 1995-06, Vol.5 (2), p.2240-2243
Main Authors: Filippov, T.V., Polyakov, Y.A., Semenov, V.K., Likharev, K.K.
Format: Article
Language:English
Subjects:
Analog-digital conversion
Circuit testing
Current measurement
Josephson junctions
Logic devices
Logic testing
Noise measurement
Signal resolution
SQUIDs
Switching circuits
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Summary:We have designed and tested a Rapid Single-Flux-Quantum (RSFQ) circuit for experimental measurement of the fluctuation-induced threshold uncertainty of switching of SFQ comparators, which are essential components of RSFQ logic devices, analog-to-digital converters, and digital SQUIDs. Statistical density of the switching events in comparators using externally-overdamped Nb-trilayer Josephson junctions has been found to be in agreement with the distribution which follows from a simple theory based on a time-dependent harmonic-oscillator model of the device. Width of the distribution (i.e, the single-shot current resolution of the comparator) measured as a function of temperature in the range 1.7-4.2 K corresponds to fundamental (thermal/quantum) fluctuations, with no evidence of excess noise sources.< >
ISSN:1051-8223
1558-2515
DOI:10.1109/77.403031