STRUCTURAL STUDIES ON MATERIALS STRUCTURAL EFFECTS IN DETERMINING SILICON CONCENTRATION IN Al-Si ALLOYS BY X-RAY FLUORESCENCE AND MASS SPECTROMETRY

The paper discusses how the structure of aluminum alloys affects the determination of silicon by x-ray fluorescence and glow-discharge mass spectrometry. As the silicon microciystals enlarge, there tends to be an exaggeration of its content. The kinetics of the silicon-ion concentration change in th...

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Bibliographic Details
Published in:Powder metallurgy and metal ceramics 2005-03, Vol.44 (3-4), p.191-195
Main Authors: Kurochkin, V D, Kravchenko, L P, Kuz'menko, L M, Tsurpal, L A
Format: Article
Language:English
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Summary:The paper discusses how the structure of aluminum alloys affects the determination of silicon by x-ray fluorescence and glow-discharge mass spectrometry. As the silicon microciystals enlarge, there tends to be an exaggeration of its content. The kinetics of the silicon-ion concentration change in the glowdischarge plasma show that cathode sputtering causes reconstruction of the surface layer. The processes are different for a binary alloy (with 3% silicon) as against multicomponent alloys. A method is proposed for diminishing the structural effect, which is based on prelinrinarv treatment of the surface with microsecond pulse discharges, which results in a microcrystalline surface layer of thickness 30-50 mum. This suppresses the structural effects and provides reliable data on the silicon content.
ISSN:1068-1302