Deflectometry based calibration of a deformable mirror for aberration correction and remote focusing in microscopy

Adaptive optics (AO) techniques enhance the capability of optical microscopy through precise control of wavefront modulations to compensate phase aberrations and improves image quality. However, the aberration correction is often limited due to the lack of dynamic range in existing calibration metho...

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Bibliographic Details
Published in:Optics express 2023-08, Vol.31 (17), p.28503
Main Authors: Temma, Kenta, Wincott, Matthew, Fujita, Katsumasa, Booth, Martin J.
Format: Article
Language:English
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Summary:Adaptive optics (AO) techniques enhance the capability of optical microscopy through precise control of wavefront modulations to compensate phase aberrations and improves image quality. However, the aberration correction is often limited due to the lack of dynamic range in existing calibration methods, such as interferometry or Shack-Hartmann (SH) wavefront sensors. Here, we use deflectometry (DF) as a calibration method for a deformable mirror (DM) to extend the available range of aberration correction. We characterised the dynamic range and accuracy of the DF-based calibration of DMs depending on the spatial frequency of the test pattern used in DF. We also demonstrated the capability of large magnitude phase control for remote-focusing over a range larger than was possible with SH sensing.
ISSN:1094-4087
1094-4087
DOI:10.1364/OE.497277