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Advanced lithography for ULSI
Lens technology has advanced to the point where lithographic feature sizes equal to, or even smaller than, the wavelength of the light used in the stepper can be achieved in production. How far optical lithography can go from here depends both on how short a wavelength is possible and how close we c...
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Published in: | IEEE circuits and devices magazine 1996-01, Vol.12 (1), p.11-15 |
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container_end_page | 15 |
container_issue | 1 |
container_start_page | 11 |
container_title | IEEE circuits and devices magazine |
container_volume | 12 |
creator | Bokor, J. Neureuther, A.R. Oldham, W.G. |
description | Lens technology has advanced to the point where lithographic feature sizes equal to, or even smaller than, the wavelength of the light used in the stepper can be achieved in production. How far optical lithography can go from here depends both on how short a wavelength is possible and how close we can come to the absolute limit of diffraction. In this article, we will examine the current thinking on these questions, and discuss what might happen if and when optical lithography really can no longer be used. |
doi_str_mv | 10.1109/101.481203 |
format | article |
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How far optical lithography can go from here depends both on how short a wavelength is possible and how close we can come to the absolute limit of diffraction. 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How far optical lithography can go from here depends both on how short a wavelength is possible and how close we can come to the absolute limit of diffraction. In this article, we will examine the current thinking on these questions, and discuss what might happen if and when optical lithography really can no longer be used.</description><subject>Focusing</subject><subject>High speed optical techniques</subject><subject>Lenses</subject><subject>Lithography</subject><subject>Optical computing</subject><subject>Optical diffraction</subject><subject>Optical interferometry</subject><subject>Production</subject><subject>Resists</subject><subject>Ultra large scale integration</subject><issn>8755-3996</issn><issn>1558-1888</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1996</creationdate><recordtype>article</recordtype><recordid>eNo90L1LA0EQBfBFFIzRxlIQUlkIF2f29mOuDCFqIGChqY-9vVlzcsnF3UTIf2_kgtUr3o9XPCFuEcaIUDwh4FgRSsjPxAC1pgyJ6FwMyGqd5UVhLsVVSl8AqEjBQNxP6h-38VyP2ma36j6j264Oo9DF0XLxPr8WF8G1iW9OORTL59nH9DVbvL3Mp5NF5qUtdplWsqi1AseVAVs5W7Ex0lRkJRW-JiCCyle1NhxsjsGT02ANc1DKhVzmQ_HQ725j973ntCvXTfLctm7D3T6VkgyhwvwIH3voY5dS5FBuY7N28VAilH8PHBPL_oEjvutxw8z_8FT-AjBmU-I</recordid><startdate>199601</startdate><enddate>199601</enddate><creator>Bokor, J.</creator><creator>Neureuther, A.R.</creator><creator>Oldham, W.G.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>199601</creationdate><title>Advanced lithography for ULSI</title><author>Bokor, J. ; Neureuther, A.R. ; Oldham, W.G.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c279t-5429d540aeb607ba7be6626b87289cd80880bcbd56ef731fc8a5076eef44af323</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1996</creationdate><topic>Focusing</topic><topic>High speed optical techniques</topic><topic>Lenses</topic><topic>Lithography</topic><topic>Optical computing</topic><topic>Optical diffraction</topic><topic>Optical interferometry</topic><topic>Production</topic><topic>Resists</topic><topic>Ultra large scale integration</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Bokor, J.</creatorcontrib><creatorcontrib>Neureuther, A.R.</creatorcontrib><creatorcontrib>Oldham, W.G.</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE circuits and devices magazine</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Bokor, J.</au><au>Neureuther, A.R.</au><au>Oldham, W.G.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Advanced lithography for ULSI</atitle><jtitle>IEEE circuits and devices magazine</jtitle><stitle>CD-M</stitle><date>1996-01</date><risdate>1996</risdate><volume>12</volume><issue>1</issue><spage>11</spage><epage>15</epage><pages>11-15</pages><issn>8755-3996</issn><eissn>1558-1888</eissn><coden>ICDMEN</coden><abstract>Lens technology has advanced to the point where lithographic feature sizes equal to, or even smaller than, the wavelength of the light used in the stepper can be achieved in production. How far optical lithography can go from here depends both on how short a wavelength is possible and how close we can come to the absolute limit of diffraction. In this article, we will examine the current thinking on these questions, and discuss what might happen if and when optical lithography really can no longer be used.</abstract><pub>IEEE</pub><doi>10.1109/101.481203</doi><tpages>5</tpages></addata></record> |
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identifier | ISSN: 8755-3996 |
ispartof | IEEE circuits and devices magazine, 1996-01, Vol.12 (1), p.11-15 |
issn | 8755-3996 1558-1888 |
language | eng |
recordid | cdi_proquest_miscellaneous_28681413 |
source | IEEE Electronic Library (IEL) Journals |
subjects | Focusing High speed optical techniques Lenses Lithography Optical computing Optical diffraction Optical interferometry Production Resists Ultra large scale integration |
title | Advanced lithography for ULSI |
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