A wide-band on-wafer noise parameter measurement system at 50-75 GHz

A wide-band on-wafer noise parameter measurement system at 50-75 GHz is presented. This measurement system is based on the cold-source method with a computer-controlled waveguide tuner. Calibrations and measurement methods are discussed and measured results for passive and active on-wafer devices ar...

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Bibliographic Details
Published in:IEEE transactions on microwave theory and techniques 2003-05, Vol.51 (5), p.1489-1495
Main Authors: Kantanen, M., Lahdes, M., Vaha-Heikkila, T., Tuovinen, J.
Format: Article
Language:English
Subjects:
Calibration
Computer simulation
Devices
HEMTs
Indium phosphide
Mathematical models
Measurement methods
Measurement uncertainty
Microwaves
MODFETs
Monte Carlo methods
Noise
Noise measurement
Testing
Tuners
Wideband
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Summary:A wide-band on-wafer noise parameter measurement system at 50-75 GHz is presented. This measurement system is based on the cold-source method with a computer-controlled waveguide tuner. Calibrations and measurement methods are discussed and measured results for passive and active on-wafer devices are shown over a 50-75 GHz range. An InP high electron-mobility transistor device is used as a test item for the active device. A Monte Carlo analysis to study measurement uncertainties is also shown. The measurement system is a useful tool in the development and verification of device noise models, as well as in device characterization.
ISSN:0018-9480
1557-9670
DOI:10.1109/TMTT.2003.810129