Texture of poled tetragonal PZT detected by synchrotron X-ray diffraction and micromechanics analysis

• Published in: Materials science & engineering. A, Structural materials : properties, microstructure and processing Structural materials : properties, microstructure and processing, 2005-11, Vol.409 (1), p.206-210
• Main Authors: Hall, D.A., Steuwer, A., Cherdhirunkorn, B., Withers, P.J., Mori, T.
• Format: Article
• Language: English
• Subjects: Condensed matter: electronic structure, electrical, magnetic, and optical properties; Cross-disciplinary physics: materials science; rheology; Dielectrics, piezoelectrics, and ferroelectrics and their properties; Domain switching; Exact sciences and technology; Ferroelectricity; Ferroelectricity and antiferroelectricity; Materials science; Micromechanics; Other heat and thermomechanical treatments; Physics; Synchrotron X-ray; Texture; Treatment of materials and its effects on microstructure and properties
• ISSN: 0921-5093; 1873-4936
• DOI: 10.1016/j.msea.2005.05.115

The texture and lattice elastic strain due to electrical poling of tetragonal PZT (lead zirconate titanate) ceramics have been measured using high energy synchrotron X-ray diffraction. It is shown that XRD peak intensity ratios associated with crystal planes of the form { 0 0 2 } , { 1 1 2 } and { 2 0 2 } exhibit a linear dependence on cos ⁡ 2 Ψ , where Ψ represents the orientation angle between the plane normal and the macroscopic poling axis. The observed dependence of texture and lattice strain on the grain orientation can be understood on the basis that the macroscopic strain due to poling is the average of the poling strains of all the individual grains.