IVB-5 effect of interface traps on the GaAs planar devices

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Bibliographic Details
Published in:IEEE transactions on electron devices 1976-11, Vol.23 (11), p.1258-1259
Main Authors: Tanimoto, M., Suzuki, K., Itoh, T., Ikoma, T., Yanai, H., Kaufmann, L.M.F., Nievendick, W., Heime, K.
Format: Article
Language:English
Online Access:Get full text
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ISSN:0018-9383
1557-9646
DOI:10.1109/T-ED.1976.18627