Two parameter Bendel model calculations for predicting protoninduced upset ICs

• Published in: IEEE transactions on nuclear science 1990-12, Vol.37 (6), p.1966-1973
• Main Authors: Stapor, W J, Meyers, J P, Langworthy, J B, Petersen, E L
• Format: Article
• Language: English
• ISSN: 0018-9499
• DOI: 10.1109/23.101216

The two-parameter model of W.L. Bendel and E.L. Petersen (1984) represents an improvement over the existing single-parameter model in terms of the goodness of fit to actual proton upset data. It especially gives a better fit to the data from devices with small feature dimensions, which ultimately leads to a more accurate proton error rate prediction. Small feature sized devices have a proton upset energy dependence that cannot be accurately described with the one-parameter model and only one data point. There are no substantial differences in proton error rate predictions from one- and two-parameter approaches for older devices with larger feature sizes