Grain boundary energy and grain growth in Al films: Comparison of experiments and simulations

Relative free energies of 〈1 1 1〉 tilt boundaries in 1.7-μm-thick Al films were compared with boundary enthalpies obtained via molecular dynamics simulations. Grain growth studies in 25 and 100-nm-thick Al films were compared with simulations. The sources of the differences between experimental and...

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Bibliographic Details
Published in:Scripta materialia 2006-03, Vol.54 (6), p.1059-1063
Main Authors: Barmak, K., Kim, J., Kim, C.-S., Archibald, W.E., Rohrer, G.S., Rollett, A.D., Kinderlehrer, D., Ta’asan, S., Zhang, H., Srolovitz, D.J.
Format: Article
Language:English
Subjects:
Aluminum
Boundaries
Free energy
Grain boundaries
Grain boundary energy
Grain growth
Molecular dynamics
Simulation
Thin films
Tilt boundaries
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Summary:Relative free energies of 〈1 1 1〉 tilt boundaries in 1.7-μm-thick Al films were compared with boundary enthalpies obtained via molecular dynamics simulations. Grain growth studies in 25 and 100-nm-thick Al films were compared with simulations. The sources of the differences between experimental and simulational results are discussed.
ISSN:1359-6462
0956-716X
1872-8456
DOI:10.1016/j.scriptamat.2005.11.060