Porous silicon - rare earth doped xerogel and glass composites

The development of components for photonics applications is growing exponentially. The sol–gel method is now recognised as a convenient and flexible way to deposit oxide or glass films on a variety of hosts, including porous silicon. In the present work we incorporated erbium and europium doped xero...

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Bibliographic Details
Published in:Physica status solidi. A, Applications and materials science Applications and materials science, 2005-06, Vol.202 (8), p.1693-1697
Main Authors: Balakrishnan, S., Gun'ko, Yurii K., Perova, T. S., Rafferty, A., Astrova, E. V., Moore, R. A.
Format: Article
Language:English
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Summary:The development of components for photonics applications is growing exponentially. The sol–gel method is now recognised as a convenient and flexible way to deposit oxide or glass films on a variety of hosts, including porous silicon. In the present work we incorporated erbium and europium doped xerogel into porous silicon and developed new porous silicon – rare earth doped glass composites. Various characteris‐ation techniques including FTIR, Raman Spectroscopy, Thermal Gravimetric Analysis and Scanning Electron Microscopy were employed in this work. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
ISSN:1862-6300
0031-8965
1862-6319
DOI:10.1002/pssa.200461229