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The state-of-the-art in simulation for optimization of SiGe-HBTs
We present the state-of-the-art in simulation for industrial application of heterostructure devices based on the SiGe/Si material system. The work includes a detailed comparison of device simulators and current transport models to be used, and addresses critical modeling issues. Results from two-dim...
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Published in: | Applied surface science 2004-03, Vol.224 (1), p.312-319 |
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Main Authors: | , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | We present the state-of-the-art in simulation for industrial application of heterostructure devices based on the SiGe/Si material system. The work includes a detailed comparison of device simulators and current transport models to be used, and addresses critical modeling issues. Results from two-dimensional hydrodynamic analyses of SiGe-heterojunction bipolar transistors (HBTs) with MINIMOS-NT are presented in good agreement with measured data. The examples are chosen to demonstrate technologically important issues which can be addressed and solved by device simulation. |
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ISSN: | 0169-4332 1873-5584 |
DOI: | 10.1016/j.apsusc.2003.09.036 |