Modeling the MTI electro-optic system sensitivity and resolution

We present an analysis methodology that offers efficient characterization of the Multispectral Thermal Imager (MTI) electro-optic system response to a wide range of user-specified system parameters and spectral scenarios. This methodology combines physics-based modeling of the MTI hardware with MTI...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on geoscience and remote sensing 2005-09, Vol.43 (9), p.1950-1963
Main Authors: Cooke, B.J., Lomheim, T.S., Laubscher, B.E., Rienstra, J.L., Clodius, W.B., Bender, S.C., Weber, P.G., Smith, B.W., Vampola, J.L., Claassen, P.J., Ballard, M., Galbraith, A.E., Borel, C.C., Atkins, W.H.
Format: Article
Language:English
Subjects:
Applied geophysics
Calibration
Earth sciences
Earth, ocean, space
Electro-optics
Exact sciences and technology
Hardware
Image analysis
Image resolution
Infrared imaging
Internal geophysics
Laboratories
Mathematical models
Methodology
Multispectral Thermal Imager (MTI)
Ocean temperature
Optical imaging
Radiometry
Sea surface
Spectra
Spectral bands
spectral modeling
thermal infrared imaging
Vegetation mapping
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We present an analysis methodology that offers efficient characterization of the Multispectral Thermal Imager (MTI) electro-optic system response to a wide range of user-specified system parameters and spectral scenarios. This methodology combines physics-based modeling of the MTI hardware with MTI prelaunch characterization data. The resulting models enable the user to generate application-specific sensitivity and resolution studies of the MTI image capture process, and aid in the development of calibration procedures and retrieval algorithms for MTI. In addition to quantifying the MTI response, the methodology developed in this paper is sufficiently general to permit the prototyping and evaluation of a variety of multispectral electro-optic systems. Finally, an example utilizing nominal orbital parameters and targeted MODTRAN scenarios that exercise the various spectral band functions is provided.
ISSN:0196-2892
1558-0644
DOI:10.1109/TGRS.2005.847922