Measurement technique for high frequency characterization of semiconducting materials in extruded cables

Knowledge on the dependence of wave propagation characteristics on material properties and cable design is important in establishing diagnostic methods for cable insulation. In this study, a high frequency measurement technique to characterize the semi-conducting screens in medium voltage cross-link...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on dielectrics and electrical insulation 2004-06, Vol.11 (3), p.471-480
Main Authors: Mugala, G., Eriksson, R., Gafvert, U., Petterson, P.
Format: Article
Language:English
Subjects:
Cable insulation
Cables
Dielectrics
Dielectrics and electrical insulation
Frequency measurement
High frequencies
Material properties
Mathematical models
Measurement techniques
Medium voltage
Polyethylene
Screens
Semiconductivity
Semiconductor materials
Semiconductors
Temperature
Voltage
Wave propagation
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Knowledge on the dependence of wave propagation characteristics on material properties and cable design is important in establishing diagnostic methods for cable insulation. In this study, a high frequency measurement technique to characterize the semi-conducting screens in medium voltage cross-linked polyethylene (XLPE) cables has been developed. The frequency ranges from 30 kHz to 500 MHz. The influence of the experimental set-up, sample preparation methods, pressure and temperature are investigated. A dielectric function is developed for the semiconducting screens and this is incorporated into a high frequency model for the cable. The propagation characteristics obtained from the high frequency cable model are compared with those obtained from measurements made on the same cables.
ISSN:1070-9878
1558-4135
DOI:10.1109/TDEI.2004.1306725