Relations between sample preparation and SKPFM Volta potential maps on an EN AW-6005 aluminium alloy

Quantitative measurements of the chemical composition and the local Volta potential contrast on metal surfaces can be performed with sub-micrometer resolution using a combination of scanning electron microscopy (SEM) and scanning kelvin probe force microscopy (SKPFM). Sample preparation techniques b...

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Bibliographic Details
Published in:Corrosion science 2005-06, Vol.47 (6), p.1506-1519
Main Authors: Tanem, Bjørn S., Svenningsen, Gaute, Mårdalen, Jostein
Format: Article
Language:English
Subjects:
A. Aluminium
Applied sciences
B. AFM
B. SEM
Corrosion
Corrosion environments
Corrosion mechanisms
Exact sciences and technology
Metals. Metallurgy
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Summary:Quantitative measurements of the chemical composition and the local Volta potential contrast on metal surfaces can be performed with sub-micrometer resolution using a combination of scanning electron microscopy (SEM) and scanning kelvin probe force microscopy (SKPFM). Sample preparation techniques based on metal removal by mechanical and electrochemical polishing, OPS and ion-sputtering, may distort the local chemical composition or microstructure on the surface. Surfaces with insignificant mechanical and chemical distortions can be produced by ultramicrotomy. Ultramicrotomy gives quantitatively reliable SEM and SKPFM results when applied on extruded samples of an EN AW-6005 aluminium alloy.
ISSN:0010-938X
1879-0496
DOI:10.1016/j.corsci.2004.07.029