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Advanced thin films of indium-tin oxide doping with photosensitive polymer via embossing process

We propose a sol-gel thin film formation process involving nanoimprint lithography. First, indium tin oxide was dissolved in 2-methoxyethanol at a ratio of 5:5 and the mixture were mixed with 10 wt% of a UV-curable. Subsequently, a polydimethylsiloxane sheet prepared by covering a silicon wafer with...

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Published in:Optics express 2023-12, Vol.31 (25), p.42077-42089
Main Authors: Oh, Jin Young, Kim, Dong Hyun, Yang, Da-Bin, Choi, Bo-Kyeong, Lee, Dong Wook, Park, Hong-Gyu, Seo, Dae-Shik
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cited_by cdi_FETCH-LOGICAL-c320t-3ec5b22f99d7cfd80b80a4a9db44a6ded673bb71c43bd7bc121caf5826263d383
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container_end_page 42089
container_issue 25
container_start_page 42077
container_title Optics express
container_volume 31
creator Oh, Jin Young
Kim, Dong Hyun
Yang, Da-Bin
Choi, Bo-Kyeong
Lee, Dong Wook
Park, Hong-Gyu
Seo, Dae-Shik
description We propose a sol-gel thin film formation process involving nanoimprint lithography. First, indium tin oxide was dissolved in 2-methoxyethanol at a ratio of 5:5 and the mixture were mixed with 10 wt% of a UV-curable. Subsequently, a polydimethylsiloxane sheet prepared by covering a silicon wafer with a polydimethylsiloxane mold was attached to a InSnO thin film to duplicate the nanostructure through UV irradiation exposure. The replicated nanostructured thin films formed about morphological and chemical composition changes on the surface, we progressed to x-ray photoelectron spectroscopy and atomic force microscopy analysis. Furthermore, atomic force microscopy image analysis showed superior patterned grooves for a UV exposure time of 3 min. A suitability test involving the measurement of the transmittance was performed for examining the suitability of the thin film for use in display devices.
doi_str_mv 10.1364/OE.499964
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_2902959591</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2902959591</sourcerecordid><originalsourceid>FETCH-LOGICAL-c320t-3ec5b22f99d7cfd80b80a4a9db44a6ded673bb71c43bd7bc121caf5826263d383</originalsourceid><addsrcrecordid>eNpNkEtLw0AUhQdRbK0u_AMyS12kziuPWZZSH1DoRtdxHjd2JMnETBLtvzelVeQu7uXwce7hIHRNyZzyRNxvVnMhpUzECZpSIkUkSJae_rsn6CKED0KoSGV6jiY8G8U4k1P0trCDqg1Y3G1djQtXVgH7Arvaur6KulHz384Ctr5x9Tv-ct0WN1vf-QB1cJ0bADe-3FXQ4sEpDJX2IezJpvUGQrhEZ4UqA1wd9wy9Pqxelk_RevP4vFysI8MZ6SIOJtaMFVLa1BQ2IzojSihptRAqsWCTlGudUiO4tqk2lFGjijhjCUu45RmfoduD7_j3s4fQ5ZULBspS1eD7kDNJmIzHoSN6d0BNO2Ztocib1lWq3eWU5PtC880qPxQ6sjdH215XYP_I3wb5D-PLcks</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2902959591</pqid></control><display><type>article</type><title>Advanced thin films of indium-tin oxide doping with photosensitive polymer via embossing process</title><source>EZB Electronic Journals Library</source><creator>Oh, Jin Young ; Kim, Dong Hyun ; Yang, Da-Bin ; Choi, Bo-Kyeong ; Lee, Dong Wook ; Park, Hong-Gyu ; Seo, Dae-Shik</creator><creatorcontrib>Oh, Jin Young ; Kim, Dong Hyun ; Yang, Da-Bin ; Choi, Bo-Kyeong ; Lee, Dong Wook ; Park, Hong-Gyu ; Seo, Dae-Shik</creatorcontrib><description>We propose a sol-gel thin film formation process involving nanoimprint lithography. First, indium tin oxide was dissolved in 2-methoxyethanol at a ratio of 5:5 and the mixture were mixed with 10 wt% of a UV-curable. Subsequently, a polydimethylsiloxane sheet prepared by covering a silicon wafer with a polydimethylsiloxane mold was attached to a InSnO thin film to duplicate the nanostructure through UV irradiation exposure. The replicated nanostructured thin films formed about morphological and chemical composition changes on the surface, we progressed to x-ray photoelectron spectroscopy and atomic force microscopy analysis. Furthermore, atomic force microscopy image analysis showed superior patterned grooves for a UV exposure time of 3 min. A suitability test involving the measurement of the transmittance was performed for examining the suitability of the thin film for use in display devices.</description><identifier>ISSN: 1094-4087</identifier><identifier>EISSN: 1094-4087</identifier><identifier>DOI: 10.1364/OE.499964</identifier><identifier>PMID: 38087589</identifier><language>eng</language><publisher>United States</publisher><ispartof>Optics express, 2023-12, Vol.31 (25), p.42077-42089</ispartof><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c320t-3ec5b22f99d7cfd80b80a4a9db44a6ded673bb71c43bd7bc121caf5826263d383</citedby><cites>FETCH-LOGICAL-c320t-3ec5b22f99d7cfd80b80a4a9db44a6ded673bb71c43bd7bc121caf5826263d383</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27903,27904</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/38087589$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Oh, Jin Young</creatorcontrib><creatorcontrib>Kim, Dong Hyun</creatorcontrib><creatorcontrib>Yang, Da-Bin</creatorcontrib><creatorcontrib>Choi, Bo-Kyeong</creatorcontrib><creatorcontrib>Lee, Dong Wook</creatorcontrib><creatorcontrib>Park, Hong-Gyu</creatorcontrib><creatorcontrib>Seo, Dae-Shik</creatorcontrib><title>Advanced thin films of indium-tin oxide doping with photosensitive polymer via embossing process</title><title>Optics express</title><addtitle>Opt Express</addtitle><description>We propose a sol-gel thin film formation process involving nanoimprint lithography. First, indium tin oxide was dissolved in 2-methoxyethanol at a ratio of 5:5 and the mixture were mixed with 10 wt% of a UV-curable. Subsequently, a polydimethylsiloxane sheet prepared by covering a silicon wafer with a polydimethylsiloxane mold was attached to a InSnO thin film to duplicate the nanostructure through UV irradiation exposure. The replicated nanostructured thin films formed about morphological and chemical composition changes on the surface, we progressed to x-ray photoelectron spectroscopy and atomic force microscopy analysis. Furthermore, atomic force microscopy image analysis showed superior patterned grooves for a UV exposure time of 3 min. A suitability test involving the measurement of the transmittance was performed for examining the suitability of the thin film for use in display devices.</description><issn>1094-4087</issn><issn>1094-4087</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2023</creationdate><recordtype>article</recordtype><recordid>eNpNkEtLw0AUhQdRbK0u_AMyS12kziuPWZZSH1DoRtdxHjd2JMnETBLtvzelVeQu7uXwce7hIHRNyZzyRNxvVnMhpUzECZpSIkUkSJae_rsn6CKED0KoSGV6jiY8G8U4k1P0trCDqg1Y3G1djQtXVgH7Arvaur6KulHz384Ctr5x9Tv-ct0WN1vf-QB1cJ0bADe-3FXQ4sEpDJX2IezJpvUGQrhEZ4UqA1wd9wy9Pqxelk_RevP4vFysI8MZ6SIOJtaMFVLa1BQ2IzojSihptRAqsWCTlGudUiO4tqk2lFGjijhjCUu45RmfoduD7_j3s4fQ5ZULBspS1eD7kDNJmIzHoSN6d0BNO2Ztocib1lWq3eWU5PtC880qPxQ6sjdH215XYP_I3wb5D-PLcks</recordid><startdate>20231204</startdate><enddate>20231204</enddate><creator>Oh, Jin Young</creator><creator>Kim, Dong Hyun</creator><creator>Yang, Da-Bin</creator><creator>Choi, Bo-Kyeong</creator><creator>Lee, Dong Wook</creator><creator>Park, Hong-Gyu</creator><creator>Seo, Dae-Shik</creator><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>20231204</creationdate><title>Advanced thin films of indium-tin oxide doping with photosensitive polymer via embossing process</title><author>Oh, Jin Young ; Kim, Dong Hyun ; Yang, Da-Bin ; Choi, Bo-Kyeong ; Lee, Dong Wook ; Park, Hong-Gyu ; Seo, Dae-Shik</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c320t-3ec5b22f99d7cfd80b80a4a9db44a6ded673bb71c43bd7bc121caf5826263d383</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2023</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Oh, Jin Young</creatorcontrib><creatorcontrib>Kim, Dong Hyun</creatorcontrib><creatorcontrib>Yang, Da-Bin</creatorcontrib><creatorcontrib>Choi, Bo-Kyeong</creatorcontrib><creatorcontrib>Lee, Dong Wook</creatorcontrib><creatorcontrib>Park, Hong-Gyu</creatorcontrib><creatorcontrib>Seo, Dae-Shik</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Optics express</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Oh, Jin Young</au><au>Kim, Dong Hyun</au><au>Yang, Da-Bin</au><au>Choi, Bo-Kyeong</au><au>Lee, Dong Wook</au><au>Park, Hong-Gyu</au><au>Seo, Dae-Shik</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Advanced thin films of indium-tin oxide doping with photosensitive polymer via embossing process</atitle><jtitle>Optics express</jtitle><addtitle>Opt Express</addtitle><date>2023-12-04</date><risdate>2023</risdate><volume>31</volume><issue>25</issue><spage>42077</spage><epage>42089</epage><pages>42077-42089</pages><issn>1094-4087</issn><eissn>1094-4087</eissn><abstract>We propose a sol-gel thin film formation process involving nanoimprint lithography. First, indium tin oxide was dissolved in 2-methoxyethanol at a ratio of 5:5 and the mixture were mixed with 10 wt% of a UV-curable. Subsequently, a polydimethylsiloxane sheet prepared by covering a silicon wafer with a polydimethylsiloxane mold was attached to a InSnO thin film to duplicate the nanostructure through UV irradiation exposure. The replicated nanostructured thin films formed about morphological and chemical composition changes on the surface, we progressed to x-ray photoelectron spectroscopy and atomic force microscopy analysis. Furthermore, atomic force microscopy image analysis showed superior patterned grooves for a UV exposure time of 3 min. A suitability test involving the measurement of the transmittance was performed for examining the suitability of the thin film for use in display devices.</abstract><cop>United States</cop><pmid>38087589</pmid><doi>10.1364/OE.499964</doi><tpages>13</tpages><oa>free_for_read</oa></addata></record>
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title Advanced thin films of indium-tin oxide doping with photosensitive polymer via embossing process
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-24T12%3A21%3A37IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Advanced%20thin%20films%20of%20indium-tin%20oxide%20doping%20with%20photosensitive%20polymer%20via%20embossing%20process&rft.jtitle=Optics%20express&rft.au=Oh,%20Jin%20Young&rft.date=2023-12-04&rft.volume=31&rft.issue=25&rft.spage=42077&rft.epage=42089&rft.pages=42077-42089&rft.issn=1094-4087&rft.eissn=1094-4087&rft_id=info:doi/10.1364/OE.499964&rft_dat=%3Cproquest_cross%3E2902959591%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c320t-3ec5b22f99d7cfd80b80a4a9db44a6ded673bb71c43bd7bc121caf5826263d383%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2902959591&rft_id=info:pmid/38087589&rfr_iscdi=true