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Estimation of Ultraviolet-A Irradiance from Measurements of 368-nm Spectral Irradiance
The estimation of ultraviolet-A (UV-A) radiation across the earth's surface is needed to model plant productivity and future impacts of ultraviolet-B radiation on plant productivity. We have developed two models to estimate the UV-A irradiance from measurements of the diffuse and global spectra...
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Published in: | Journal of atmospheric and oceanic technology 2005-12, Vol.22 (12), p.1853-1863 |
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Main Authors: | , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The estimation of ultraviolet-A (UV-A) radiation across the earth's surface is needed to model plant productivity and future impacts of ultraviolet-B radiation on plant productivity. We have developed two models to estimate the UV-A irradiance from measurements of the diffuse and global spectral irradiance at 368 nm. The models were developed from 30-min-interval measurements made throughout 2000 at three locations across the United States and evaluated from 30-min measurements made throughout 2000 at three additional locations and throughout 2001 and 2002 at seven locations. UV-A irradiance was best estimated from measured global 368-nm irradiance and empirical functions defining the UV-A and 368-nm irradiance values estimated from a theoretical pseudospherical two-stream discrete-ordinates radiative transfer model. The radiative transfer model provided baseline irradiance relationships between UV-A irradiance and 368-nm spectral irradiance. The semiempirical model estimated the UV-A irradiance at seven locations across the United States with a mean bias error of 0.5 W m-2 and a root-mean-square error of 2 W m-2, corresponding to approximately c4% of a clear-sky irradiance of 50 W m-2 for a solar zenith angle of 30'. This model error was comparable to the combined effect of previously estimated UV-A and 368-nm irradiance measurement errors. |
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ISSN: | 0739-0572 1520-0426 |
DOI: | 10.1175/JTECH1823.1 |