Superconducting tunnel junctions for use as energy resolving X-ray detectors

The response of Nb-Al-Al/sub 2/O/sub 3/-Al-Nb superconductor-insulator-superconductor (SIS) tunnel junctions to pulsed 650-nm radiation was measured. The rise in the voltage developed across the junction increases linearly for the duration of the applied pulse. The decay time of 300 mu s is an intri...

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Bibliographic Details
Published in:IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States) 1991-03, Vol.27 (2), p.2665-2668
Main Authors: Van Vechten, D., Boyer, C., Fritz, G.G., King, S., Kowaski, M.P., Lovellette, M.N., Blamire, M.G., Kirk, E., Somekh, R.E.
Format: Article
Language:English
Subjects:
440200 > Radiation Effects on Instrument Components, Instruments, or Electronic Systems
665411 > Basic Superconductivity Studies-- (1992-)
ALUMINIUM COMPOUNDS
ALUMINIUM OXIDES
Applied sciences
Capacitance
CHALCOGENIDES
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
Current measurement
DETECTION
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
Electronics
ELEMENTS
ENERGY RANGE
Energy resolution
Exact sciences and technology
FABRICATION
Impedance
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
Josephson junctions
JUNCTIONS
KEV RANGE
KEV RANGE 01-10
LAYERS
MEASURING INSTRUMENTS
METALS
NIOBIUM
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
PHYSICAL RADIATION EFFECTS
Preamplifiers
RADIATION DETECTION
RADIATION DETECTORS
RADIATION EFFECTS
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Superconducting devices
SUPERCONDUCTING JUNCTIONS
SUPERCONDUCTIVITY
THERMAL CYCLING
Tin
TRANSITION ELEMENTS 665412 > Superconducting Devices-- (1992-)
TUNNEL EFFECT
Voltage
X-RAY DETECTION
X-ray detectors
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Summary:The response of Nb-Al-Al/sub 2/O/sub 3/-Al-Nb superconductor-insulator-superconductor (SIS) tunnel junctions to pulsed 650-nm radiation was measured. The rise in the voltage developed across the junction increases linearly for the duration of the applied pulse. The decay time of 300 mu s is an intrinsic property of the junction. The response of the junction varies linearly with incident energy over the range 35 to 200 eV/ mu m/sup 2/. Comparison with the junction response caused by higher energy particles should give insight into the microscopic details of the extremely nonequilibrium pair breaking.
ISSN:0018-9464
1941-0069
DOI:10.1109/20.133760