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Wave-Follower Field Measurements of the Wind-Input Spectral Function. Part I: Measurements and Calibrations
An experimental study of wind energy and momentum input into finite-depth wind waves was undertaken at Lake George, New South Wales, Australia. To measure microscale oscillations of induced pressure above surface waves, a high-precision wave-follower system was developed at the University of Miami,...
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Published in: | Journal of atmospheric and oceanic technology 2005-07, Vol.22 (7), p.799-813 |
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Main Authors: | , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | An experimental study of wind energy and momentum input into finite-depth wind waves was undertaken at Lake George, New South Wales, Australia. To measure microscale oscillations of induced pressure above surface waves, a high-precision wave-follower system was developed at the University of Miami, Florida. The principal sensing hardware included Elliott pressure probes, hot-film anemometers, and Pitot tubes. The wave-follower recordings were supplemented by a complete set of relevant measurements in the atmospheric boundary layer, on the surface, and in the water body. This paper is dedicated to technical aspects of the measurement procedure and data analysis. The precision of the feedback wave-following mechanism did not impose any restrictions on the measurement accuracy in the range of wave heights and frequencies relevant to the problem. Thorough calibrations of the pressure transducers and moving Elliott probes were conducted. It is shown that the response of the air column in the connecting tubes provides a frequency-dependent phase shift, which must be accounted for to recover the low-level induced pressure signal. In the finite-depth environment of Lake George, breaking waves play an important role in the momentum exchange between wind and waves, as will be shown in a subsequent paper. |
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ISSN: | 0739-0572 1520-0426 |
DOI: | 10.1175/JTECH1725.1 |