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Growth of high-quality In-rich InGaN alloys by RF–MBE for the fabrication of InN-based quantum well structures
This paper describes studies performed for improving the quality of In-rich In x Ga 1− x N alloys. The crystalline quality and surface morphology of In-rich In x Ga 1− x N films was improved by using InN templates as underlying layers. It was also found that the crystalline quality of In-rich In x G...
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Published in: | Journal of crystal growth 2006-03, Vol.288 (2), p.283-288 |
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Main Authors: | , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | This paper describes studies performed for improving the quality of In-rich In
x
Ga
1−
x
N alloys. The crystalline quality and surface morphology of In-rich In
x
Ga
1−
x
N films was improved by using InN templates as underlying layers. It was also found that the crystalline quality of In-rich In
x
Ga
1−
x
N was strongly correlated with that of the underlying InN templates. High-quality InN templates with the (0
0
0
2) X-ray rocking curves (XRCs) as narrow as 1
arcmin, have recently been achieved by optimizing the nitridation conditions of (0
0
0
1) sapphire substrates (300
°C, 2
h). These InN templates have provided further improvement of the crystalline quality of In
0.8Ga
0.2N films. The (0
0
0
2) XRCs for these In
0.8Ga
0.2N films were approximately 18
arcmin (full-width at half-maximum), dramatically narrower than the 36
arcmin obtained with a previous substrate-nitridation process (550
°C, 1
h). By employing these high-quality In
0.8Ga
0.2N layers as not only growth templates but also bottom barrier layers, an InN/In
0.8Ga
0.2N multiple quantum well (MQW) structure and single-quantum well (SQW) structures with different well widths were fabricated. The MQW structure showed clear 1st and 2nd satellite peaks of X-ray diffraction. The SQW structures exhibited photoluminescence emission from their well layers. |
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ISSN: | 0022-0248 1873-5002 |
DOI: | 10.1016/j.jcrysgro.2005.12.008 |