Loading…
A contribution of Molecular Dynamics simulation to sophisticated engineering of coating processes applied to PVD DC sputter deposition
Usually, the development of sputtered layer systems as well as their manufacturing are characterised by empirical methods. Therefore, a simulation tool based on Molecular Dynamics (MD) for sophisticated engineering of PVD sputter deposition was developed. With this tool it is possible to correlate c...
Saved in:
Published in: | Surface & coatings technology 2005-10, Vol.200 (1-4), p.872-875 |
---|---|
Main Authors: | , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | cdi_FETCH-LOGICAL-c404t-4a0d3a7bbdc61d78e11537e3c454722cc6a627b83d23868cf1e700ca5ae014033 |
---|---|
cites | cdi_FETCH-LOGICAL-c404t-4a0d3a7bbdc61d78e11537e3c454722cc6a627b83d23868cf1e700ca5ae014033 |
container_end_page | 875 |
container_issue | 1-4 |
container_start_page | 872 |
container_title | Surface & coatings technology |
container_volume | 200 |
creator | Westkämper, E. Klein, P. Gottwald, B. Sommadossi, S. Baumann, P. Gemmler, A. |
description | Usually, the development of sputtered layer systems as well as their manufacturing are characterised by empirical methods. Therefore, a simulation tool based on Molecular Dynamics (MD) for sophisticated engineering of PVD sputter deposition was developed. With this tool it is possible to correlate coating relevant process parameters to resulting coating properties. The existing MD had to be extended: mesoscopic boundary conditions for MD had to be developed in order to describe the substrate and a continuously differentiable atomistic observable for the local stress tensor consistent with thermodynamics had to be formulated. Input parameters for MD simulation are the substrate temperature and the in situ monitored data of the particle flow. Due to this approach more detailed information about the microscopic origin of stress formation and coating morphology is obtained. |
doi_str_mv | 10.1016/j.surfcoat.2005.01.102 |
format | article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_29163183</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0257897205001337</els_id><sourcerecordid>28484323</sourcerecordid><originalsourceid>FETCH-LOGICAL-c404t-4a0d3a7bbdc61d78e11537e3c454722cc6a627b83d23868cf1e700ca5ae014033</originalsourceid><addsrcrecordid>eNqNkc9u1DAQxiNEJZbCKyBf4Jat_yX23qh2C0UqooeWq-WdTIpX2Th4HKS-AM-NwxZxhNOMPv2-mdF8VfVG8LXgor04rGlOPUSf15LzZs1F0eWzaiWs2dRKafO8WnHZmNpujHxRvSQ6cM6F2ehV9fOSQRxzCvs5hziy2LPPcUCYB5_Y7nH0xwDEKByL8BvIkVGcvgXKAXzGjuH4EEbEFMaHxb3csbRTioBESMxP0xAKWJy3X3dst2U0zTljYh1OkcIy9lV11vuB8PVTPa_uP1zdba_rmy8fP20vb2rQXOdae94pb_b7DlrRGYtCNMqgAt1oIyVA61tp9lZ1UtnWQi_QcA6-8ciF5kqdV-9Oc8t532ek7I6BAIfBjxhncnIjWiXsf4BWW63kArYnEFIkSti7KYWjT49OcLfk4w7uTz5uycdxUXRZjG-fNngCP_TJjxDor9tobbk2hXt_4rD85UfA5AgCjoBdSAjZdTH8a9UvOwusYw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>28484323</pqid></control><display><type>article</type><title>A contribution of Molecular Dynamics simulation to sophisticated engineering of coating processes applied to PVD DC sputter deposition</title><source>ScienceDirect Freedom Collection</source><creator>Westkämper, E. ; Klein, P. ; Gottwald, B. ; Sommadossi, S. ; Baumann, P. ; Gemmler, A.</creator><creatorcontrib>Westkämper, E. ; Klein, P. ; Gottwald, B. ; Sommadossi, S. ; Baumann, P. ; Gemmler, A.</creatorcontrib><description>Usually, the development of sputtered layer systems as well as their manufacturing are characterised by empirical methods. Therefore, a simulation tool based on Molecular Dynamics (MD) for sophisticated engineering of PVD sputter deposition was developed. With this tool it is possible to correlate coating relevant process parameters to resulting coating properties. The existing MD had to be extended: mesoscopic boundary conditions for MD had to be developed in order to describe the substrate and a continuously differentiable atomistic observable for the local stress tensor consistent with thermodynamics had to be formulated. Input parameters for MD simulation are the substrate temperature and the in situ monitored data of the particle flow. Due to this approach more detailed information about the microscopic origin of stress formation and coating morphology is obtained.</description><identifier>ISSN: 0257-8972</identifier><identifier>EISSN: 1879-3347</identifier><identifier>DOI: 10.1016/j.surfcoat.2005.01.102</identifier><identifier>CODEN: SCTEEJ</identifier><language>eng</language><publisher>Lausanne: Elsevier B.V</publisher><subject>Applied sciences ; Coating properties ; Cross-disciplinary physics: materials science; rheology ; Exact sciences and technology ; Materials science ; Metals. Metallurgy ; Other topics in materials science ; Physics ; Production techniques ; Sputter deposition ; Stress tensors ; Surface treatment ; Tight-binding</subject><ispartof>Surface & coatings technology, 2005-10, Vol.200 (1-4), p.872-875</ispartof><rights>2005 Elsevier B.V.</rights><rights>2006 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c404t-4a0d3a7bbdc61d78e11537e3c454722cc6a627b83d23868cf1e700ca5ae014033</citedby><cites>FETCH-LOGICAL-c404t-4a0d3a7bbdc61d78e11537e3c454722cc6a627b83d23868cf1e700ca5ae014033</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>309,310,314,780,784,789,790,23930,23931,25140,27924,27925</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=17448047$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Westkämper, E.</creatorcontrib><creatorcontrib>Klein, P.</creatorcontrib><creatorcontrib>Gottwald, B.</creatorcontrib><creatorcontrib>Sommadossi, S.</creatorcontrib><creatorcontrib>Baumann, P.</creatorcontrib><creatorcontrib>Gemmler, A.</creatorcontrib><title>A contribution of Molecular Dynamics simulation to sophisticated engineering of coating processes applied to PVD DC sputter deposition</title><title>Surface & coatings technology</title><description>Usually, the development of sputtered layer systems as well as their manufacturing are characterised by empirical methods. Therefore, a simulation tool based on Molecular Dynamics (MD) for sophisticated engineering of PVD sputter deposition was developed. With this tool it is possible to correlate coating relevant process parameters to resulting coating properties. The existing MD had to be extended: mesoscopic boundary conditions for MD had to be developed in order to describe the substrate and a continuously differentiable atomistic observable for the local stress tensor consistent with thermodynamics had to be formulated. Input parameters for MD simulation are the substrate temperature and the in situ monitored data of the particle flow. Due to this approach more detailed information about the microscopic origin of stress formation and coating morphology is obtained.</description><subject>Applied sciences</subject><subject>Coating properties</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Exact sciences and technology</subject><subject>Materials science</subject><subject>Metals. Metallurgy</subject><subject>Other topics in materials science</subject><subject>Physics</subject><subject>Production techniques</subject><subject>Sputter deposition</subject><subject>Stress tensors</subject><subject>Surface treatment</subject><subject>Tight-binding</subject><issn>0257-8972</issn><issn>1879-3347</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNqNkc9u1DAQxiNEJZbCKyBf4Jat_yX23qh2C0UqooeWq-WdTIpX2Th4HKS-AM-NwxZxhNOMPv2-mdF8VfVG8LXgor04rGlOPUSf15LzZs1F0eWzaiWs2dRKafO8WnHZmNpujHxRvSQ6cM6F2ehV9fOSQRxzCvs5hziy2LPPcUCYB5_Y7nH0xwDEKByL8BvIkVGcvgXKAXzGjuH4EEbEFMaHxb3csbRTioBESMxP0xAKWJy3X3dst2U0zTljYh1OkcIy9lV11vuB8PVTPa_uP1zdba_rmy8fP20vb2rQXOdae94pb_b7DlrRGYtCNMqgAt1oIyVA61tp9lZ1UtnWQi_QcA6-8ciF5kqdV-9Oc8t532ek7I6BAIfBjxhncnIjWiXsf4BWW63kArYnEFIkSti7KYWjT49OcLfk4w7uTz5uycdxUXRZjG-fNngCP_TJjxDor9tobbk2hXt_4rD85UfA5AgCjoBdSAjZdTH8a9UvOwusYw</recordid><startdate>20051001</startdate><enddate>20051001</enddate><creator>Westkämper, E.</creator><creator>Klein, P.</creator><creator>Gottwald, B.</creator><creator>Sommadossi, S.</creator><creator>Baumann, P.</creator><creator>Gemmler, A.</creator><general>Elsevier B.V</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>7TB</scope><scope>FR3</scope></search><sort><creationdate>20051001</creationdate><title>A contribution of Molecular Dynamics simulation to sophisticated engineering of coating processes applied to PVD DC sputter deposition</title><author>Westkämper, E. ; Klein, P. ; Gottwald, B. ; Sommadossi, S. ; Baumann, P. ; Gemmler, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c404t-4a0d3a7bbdc61d78e11537e3c454722cc6a627b83d23868cf1e700ca5ae014033</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Applied sciences</topic><topic>Coating properties</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Exact sciences and technology</topic><topic>Materials science</topic><topic>Metals. Metallurgy</topic><topic>Other topics in materials science</topic><topic>Physics</topic><topic>Production techniques</topic><topic>Sputter deposition</topic><topic>Stress tensors</topic><topic>Surface treatment</topic><topic>Tight-binding</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Westkämper, E.</creatorcontrib><creatorcontrib>Klein, P.</creatorcontrib><creatorcontrib>Gottwald, B.</creatorcontrib><creatorcontrib>Sommadossi, S.</creatorcontrib><creatorcontrib>Baumann, P.</creatorcontrib><creatorcontrib>Gemmler, A.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Engineering Research Database</collection><jtitle>Surface & coatings technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Westkämper, E.</au><au>Klein, P.</au><au>Gottwald, B.</au><au>Sommadossi, S.</au><au>Baumann, P.</au><au>Gemmler, A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A contribution of Molecular Dynamics simulation to sophisticated engineering of coating processes applied to PVD DC sputter deposition</atitle><jtitle>Surface & coatings technology</jtitle><date>2005-10-01</date><risdate>2005</risdate><volume>200</volume><issue>1-4</issue><spage>872</spage><epage>875</epage><pages>872-875</pages><issn>0257-8972</issn><eissn>1879-3347</eissn><coden>SCTEEJ</coden><abstract>Usually, the development of sputtered layer systems as well as their manufacturing are characterised by empirical methods. Therefore, a simulation tool based on Molecular Dynamics (MD) for sophisticated engineering of PVD sputter deposition was developed. With this tool it is possible to correlate coating relevant process parameters to resulting coating properties. The existing MD had to be extended: mesoscopic boundary conditions for MD had to be developed in order to describe the substrate and a continuously differentiable atomistic observable for the local stress tensor consistent with thermodynamics had to be formulated. Input parameters for MD simulation are the substrate temperature and the in situ monitored data of the particle flow. Due to this approach more detailed information about the microscopic origin of stress formation and coating morphology is obtained.</abstract><cop>Lausanne</cop><pub>Elsevier B.V</pub><doi>10.1016/j.surfcoat.2005.01.102</doi><tpages>4</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0257-8972 |
ispartof | Surface & coatings technology, 2005-10, Vol.200 (1-4), p.872-875 |
issn | 0257-8972 1879-3347 |
language | eng |
recordid | cdi_proquest_miscellaneous_29163183 |
source | ScienceDirect Freedom Collection |
subjects | Applied sciences Coating properties Cross-disciplinary physics: materials science rheology Exact sciences and technology Materials science Metals. Metallurgy Other topics in materials science Physics Production techniques Sputter deposition Stress tensors Surface treatment Tight-binding |
title | A contribution of Molecular Dynamics simulation to sophisticated engineering of coating processes applied to PVD DC sputter deposition |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T23%3A07%3A57IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%20contribution%20of%20Molecular%20Dynamics%20simulation%20to%20sophisticated%20engineering%20of%20coating%20processes%20applied%20to%20PVD%20DC%20sputter%20deposition&rft.jtitle=Surface%20&%20coatings%20technology&rft.au=Westk%C3%A4mper,%20E.&rft.date=2005-10-01&rft.volume=200&rft.issue=1-4&rft.spage=872&rft.epage=875&rft.pages=872-875&rft.issn=0257-8972&rft.eissn=1879-3347&rft.coden=SCTEEJ&rft_id=info:doi/10.1016/j.surfcoat.2005.01.102&rft_dat=%3Cproquest_cross%3E28484323%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c404t-4a0d3a7bbdc61d78e11537e3c454722cc6a627b83d23868cf1e700ca5ae014033%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=28484323&rft_id=info:pmid/&rfr_iscdi=true |