Control of random texture of monocrystalline silicon cells by angle-resolved optical reflectance

Light reflectance patterns in chemically textured (1 0 0)Si wafers exhibit 4-fold symmetry with intensity maxima at well-defined off centre angular positions. The relation between the light pattern and the geometrical features of the texture is discussed. A method that relates the reflected intensit...

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Bibliographic Details
Published in:Solar energy materials and solar cells 2005-05, Vol.87 (1), p.583-593
Main Authors: Forniés, E., Zaldo, C., Albella, J.M.
Format: Article
Language:English
Subjects:
Applied sciences
Energy
Equipments, installations and applications
Exact sciences and technology
Natural energy
Optical-reflectance
Photovoltaic conversion
Photovoltaic-cells
Si-texture
Solar cells. Photoelectrochemical cells
Solar energy
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Summary:Light reflectance patterns in chemically textured (1 0 0)Si wafers exhibit 4-fold symmetry with intensity maxima at well-defined off centre angular positions. The relation between the light pattern and the geometrical features of the texture is discussed. A method that relates the reflected intensities with the texture degree is developed and tested.
ISSN:0927-0248
1879-3398
DOI:10.1016/j.solmat.2004.07.040