Evaluation by SEM-EDS of the Presence of Manufacturing Residual Materials on Non-invasive Ventilation (NIV) Masks

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Bibliographic Details
Published in:Microscopy and microanalysis 2023-07, Vol.29 (Supplement_1), p.150-151
Main Authors: González-Mancera, Guillermina, Mervich-Sigal, Nicolas, Paz-Michel, Brenda A, Morales-García, Joaquin
Format: Article
Language:English
Online Access:Get full text
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ISSN:1431-9276
1435-8115
DOI:10.1093/micmic/ozad067.068