Fault tolerance properties in quantum-dot cellular automata devices

We present a study of the joint influence of temperature and fabrication defects on the operation of quantum-dot cellular automata (QCA) devices. Canonical ensemble, a Hubbard-type Hamiltonian and the inter-cellular Hartree approximation were used, and a statistical model has been introduced to simu...

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Bibliographic Details
Published in:Journal of physics. D, Applied physics Applied physics, 2006-04, Vol.39 (8), p.1489-1494
Main Authors: Khatun, M, Barclay, T, Sturzu, I, Tougaw, P D
Format: Article
Language:English
Subjects:
Applied sciences
Automata. Abstract machines. Turing machines
Circuit properties
Computer science
control theory
systems
Digital circuits
Electric, optical and optoelectronic circuits
Electronic circuits
Electronics
Exact sciences and technology
Molecular electronics, nanoelectronics
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Theoretical computing
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Summary:We present a study of the joint influence of temperature and fabrication defects on the operation of quantum-dot cellular automata (QCA) devices. Canonical ensemble, a Hubbard-type Hamiltonian and the inter-cellular Hartree approximation were used, and a statistical model has been introduced to simulate defects in the QCA devices. Parameters such as success rate and breakdown displacement factor (BDF) were defined and calculated numerically. Results show the thermal dependence of BDF values of the QCA devices. The BDF values decrease with temperature. The joint influence of randomly missing dots and temperature was also studied.
ISSN:0022-3727
1361-6463
DOI:10.1088/0022-3727/39/8/006