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All optical read-out radiation dosimeter using CVD synthetic diamond

In the present work, we evaluate the optically stimulated luminescence (OSL) dosimetric properties of two polycrystalline 10 μm thick films, undoped and 750 ppm nitrogen doped, grown on (100) silicon substrates exposed to beta radiation. The samples were optically stimulated to free and to induce ra...

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Bibliographic Details
Published in:Physica status solidi. A, Applications and materials science Applications and materials science, 2006-09, Vol.203 (12), p.3173-3178
Main Authors: Preciado-Flores, S., Schreck, M., Meléndrez, R., Chernov, V., Pedroza-Montero, M., Barboza-Flores, M.
Format: Article
Language:English
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Summary:In the present work, we evaluate the optically stimulated luminescence (OSL) dosimetric properties of two polycrystalline 10 μm thick films, undoped and 750 ppm nitrogen doped, grown on (100) silicon substrates exposed to beta radiation. The samples were optically stimulated to free and to induce radiative recombination of the trapped charges caused by radiation absorption. This all optical technique uses IR laser 830 nm light for stimulation and a PMT coupled to a BG‐39 (300–600 nm) filter for light intensity measurements. The OSL of both samples is very similar in output intensity and hyperbolic decay type. The OSL signal of non doped samples involves localized trapping states around the 373–653 K as compared to nitrogen doped sample which involves the charge detrapping of localized states in the 353–550 K range. The OSL signal in the first 0.16 s shows two linearity regions for 0–35 Gy and 35–100 Gy dose ranges. An obvious advantage of OSL over TL/TSC methods is that no heating is required, it may also open the possibility of using CVD diamond coupled to optical fibers for stimulation and read‐out light signals allowing in situ and real time dose measurements. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
ISSN:1862-6300
0031-8965
1862-6319
DOI:10.1002/pssa.200671108