Future analytical needs for industry and technology

This paper summarizes reports and opinions presented during a Roundtable Session of the same title at the 13th International Conference on Ion Beam Analysis, Lisbon, 1997. The evolution of new technologies and new fields of research is creating new demands for advanced materials analysis, often at a...

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 1998-03, Vol.136, p.35-41
Main Authors: Baglin, J.E.E., Davis, J.C., Gabella, P., Prozesky, V.M., Sie, S.
Format: Article
Language:English
Subjects:
AMS
Biomedical engineering
Biomedicine
Electronics industry
Future analytical needs
Geology
Geoscience
Ion microbeams
Materials science
Medical applications
Mineralogy
Minerals
PIXE
Semiconductor materials
Semiconductors
Technical presentations
Technological forecasting
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Description
Summary:This paper summarizes reports and opinions presented during a Roundtable Session of the same title at the 13th International Conference on Ion Beam Analysis, Lisbon, 1997. The evolution of new technologies and new fields of research is creating new demands for advanced materials analysis, often at a level not attainable with current techniques. We therefore explore some opportunities for creative development of new or enhanced ion beam techniques to satisfy major predictable needs of the future. In particular, new analytical applications are discussed for the semiconductor industry, for biomedical research, and for advanced research in minerals and geoscience.
ISSN:0168-583X
1872-9584
DOI:10.1016/S0168-583X(97)00832-X