Key Factors Controlling Camber Behavior During the Cofiring of Bi-Layer Ceramic Dielectric Laminates

A bi‐layer low‐temperature‐cofired ceramic laminate with different dielectric constants has been used to investigate the key factors controlling camber behavior during cofiring. Camber development, which is caused by the linear shrinkage rate difference between dielectrics, becomes more significant...

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Bibliographic Details
Published in:Journal of the American Ceramic Society 2005-09, Vol.88 (9), p.2429-2434
Main Authors: Hsu, Rung-Tsung, Jean, Jau-Ho
Format: Article
Language:English
Subjects:
Applied sciences
Building materials. Ceramics. Glasses
Ceramic industries
Ceramic sintering
Cermets, ceramic and refractory composites
Chemical industry and chemicals
Cross-disciplinary physics: materials science
rheology
Dielectrics
Electrotechnical and electronic ceramics
Exact sciences and technology
Laminates
Materials science
Other materials
Physics
Specific materials
Technical ceramics
Temperature
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Description
Summary:A bi‐layer low‐temperature‐cofired ceramic laminate with different dielectric constants has been used to investigate the key factors controlling camber behavior during cofiring. Camber development, which is caused by the linear shrinkage rate difference between dielectrics, becomes more significant with decreasing thickness of dielectric. No cofiring defects, such as de‐densification, de‐bonding, and channel cracks, are observed in the multilayer structure of mixed dielectric laminates. This is because of the fact that a common sintering flux is used in both dielectrics, and the sintering mismatch stress generated in the dielectric layer is less than that of sintering potential.
ISSN:0002-7820
1551-2916
DOI:10.1111/j.1551-2916.2005.00496.x