MATHEMATICAL STUDY OF METAL NANOPARTICLE SIZE DETERMINATION BY SINGLE X-RAY LINE PROFILE ANALYSIS

The new theoretical outline for determination of the metal crystallite nanosize and lattice strain from X-ray diffraction line profile broadening is discussed. Emphasis is made on the rigorous analysis of the line profiles in terms of Fourier transform. Fermi generalized distribution function for si...

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Bibliographic Details
Published in:Journal of Optoelectronics and Advanced Materials 2005-12, Vol.7 (6), p.3093-3100
Main Authors: Aldea, N, Barz, B, Silipas, T D, Alde, F, Wu, Z
Format: Article
Language:English
Online Access:Get full text
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Summary:The new theoretical outline for determination of the metal crystallite nanosize and lattice strain from X-ray diffraction line profile broadening is discussed. Emphasis is made on the rigorous analysis of the line profiles in terms of Fourier transform. Fermi generalized distribution function for single X-ray line profile approximation is used in order to determine the crystallite size and the lattice strain by the deconvolution technique. The microstructural parameters are obtained by the use of the Warren and Averbach theory and are included in the general form of the Fourier transform of the true sample. A comparison of microstructural models of the supported nickel catalysts determined by various analytical approximations is presented. Practical examples that emphasize the influence of the ideal standard line profiles of supported nickel catalysts as experimental samples are given. The measurements were performed on Beijing Synchrotron Radiation Facilities.
ISSN:1454-4164