An APL pattern-directed module for bidimensional data analysis

We suggest that APL may effectively be used for the implementation of pattern directed production systems (PDPS) for the analysis of bidimensional data. These systems look for interesting or important situations occurring as patterns in their input or memory data. These patterns cause the execution...

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Bibliographic Details
Published in:APL quote quad 1981-09, Vol.12 (1), p.54-61
Main Authors: Bianchi, Silvana, Mussio, Piero, Ventura, Anna Della, Rampini, Anna, Dell'Oca, Maurizio
Format: Article
Language:English
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Summary:We suggest that APL may effectively be used for the implementation of pattern directed production systems (PDPS) for the analysis of bidimensional data. These systems look for interesting or important situations occurring as patterns in their input or memory data. These patterns cause the execution of suitable functions. Moreover APL makes it possible to carry out in a natural manner the synthetic and expressive definition of the patterns and then allows to verify the efficacy and power of such definition. We face these problems through MIPS (Module Interpreter for Production Systems). In the work described, simple idioms and skeletons are used to set up the definitions and the instruments. The system is described through two examples of application to the analysis of digital images from different experiments.
ISSN:0163-6006
DOI:10.1145/390007.805335