Nanoscale investigation of moisture-induced degradation mechanisms of tris(8-hydroxyquinoline) aluminium-based organic light-emitting diodes

By exploiting tapping mode atomic force microscopy, the moisture-induced degradation mechanisms of ITO (indium tin oxide)-coated glass/CuPc (copper phthalocyanine)/NPB (N, N'-di(naphthalene-1-yl)-N, N'-diphthalbenzidine)/Alq3 (tris(8-hydroxyquinoline) aluminium)-based organic light-emittin...

Full description

Saved in:
Bibliographic Details
Published in:Journal of physics. D, Applied physics Applied physics, 2004-09, Vol.37 (18), p.2618-2622
Main Authors: Xu, M S, Xu, J B, Chen, H Z, Wang, M
Format: Article
Language:English
Subjects:
Applied sciences
Electronics
Exact sciences and technology
Optoelectronic devices
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c382t-995d4604acef094edd4973a3b16f7c87d57a4cd950bdbf397dc4ef6f6b711bdc3
cites cdi_FETCH-LOGICAL-c382t-995d4604acef094edd4973a3b16f7c87d57a4cd950bdbf397dc4ef6f6b711bdc3
container_end_page 2622
container_issue 18
container_start_page 2618
container_title Journal of physics. D, Applied physics
container_volume 37
creator Xu, M S
Xu, J B
Chen, H Z
Wang, M
description By exploiting tapping mode atomic force microscopy, the moisture-induced degradation mechanisms of ITO (indium tin oxide)-coated glass/CuPc (copper phthalocyanine)/NPB (N, N'-di(naphthalene-1-yl)-N, N'-diphthalbenzidine)/Alq3 (tris(8-hydroxyquinoline) aluminium)-based organic light-emitting diodes without cathode were investigated. It is found that three types of degradation mechanisms are associated with moisture-exposed Alq3 films, when the device is exposed to moisture, namely, hydration of Alq3, crystallization of Alq3 and reaction of the Alq3 complex with H2O. Crystallization of the NPB layer of ITO/CuPc/NPB was observed on exposure to moisture, and de-wetting simultaneously takes place at the interface of CuPc/NPB. Indium and/or oxygen may diffuse from ITO into the organic layers. These observations provide a clear picture of the moisture-induced degradation mechanisms of the ITO/CuPc/NPB/Alq3-based OLEDs.
doi_str_mv 10.1088/0022-3727/37/18/019
format article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_29423039</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>29423039</sourcerecordid><originalsourceid>FETCH-LOGICAL-c382t-995d4604acef094edd4973a3b16f7c87d57a4cd950bdbf397dc4ef6f6b711bdc3</originalsourceid><addsrcrecordid>eNqNkMtq3DAUhkVoINO0T9CNNw1NQBnJ8kjWMoT0AiHZJGsh6-I5xZYmkh0y75CHrsyEdtEuujmHg77_B30IfaLkkpK2XRNS15iJWqyZWNNyU3mEVpRxinnD2Tu0-k2coPc5_ySEbHhLV-j1ToeYjR5cBeHZ5Ql6PUEMVfTVGCFPc3IYgp2Ns5V1fdL28D46s9UB8pgXdEqQv7R4u7cpvuyfZghxgODOKz3MIwSYR9zpXCpi6kvKVAP02wm7EaYJQl9ZiNblD-jY6yG7j2_7FD1-vXm4_o5v77_9uL66xYa19YSl3NiGk0Yb54lsnLWNFEyzjnIvTCvsRujGWLkhne08k8KaxnnueSco7axhp-js0LtL8Wkun1YjZOOGQQcX56xq2dSMMFlAdgBNijkn59UuwajTXlGiFvNq8aoWr2UoWm66pD6_1evFrE86GMh_opzS4p8V7vLAQdz9Z_HF34F_gGpnPfsF9GijAw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>29423039</pqid></control><display><type>article</type><title>Nanoscale investigation of moisture-induced degradation mechanisms of tris(8-hydroxyquinoline) aluminium-based organic light-emitting diodes</title><source>Institute of Physics:Jisc Collections:IOP Publishing Read and Publish 2024-2025 (Reading List)</source><creator>Xu, M S ; Xu, J B ; Chen, H Z ; Wang, M</creator><creatorcontrib>Xu, M S ; Xu, J B ; Chen, H Z ; Wang, M</creatorcontrib><description>By exploiting tapping mode atomic force microscopy, the moisture-induced degradation mechanisms of ITO (indium tin oxide)-coated glass/CuPc (copper phthalocyanine)/NPB (N, N'-di(naphthalene-1-yl)-N, N'-diphthalbenzidine)/Alq3 (tris(8-hydroxyquinoline) aluminium)-based organic light-emitting diodes without cathode were investigated. It is found that three types of degradation mechanisms are associated with moisture-exposed Alq3 films, when the device is exposed to moisture, namely, hydration of Alq3, crystallization of Alq3 and reaction of the Alq3 complex with H2O. Crystallization of the NPB layer of ITO/CuPc/NPB was observed on exposure to moisture, and de-wetting simultaneously takes place at the interface of CuPc/NPB. Indium and/or oxygen may diffuse from ITO into the organic layers. These observations provide a clear picture of the moisture-induced degradation mechanisms of the ITO/CuPc/NPB/Alq3-based OLEDs.</description><identifier>ISSN: 0022-3727</identifier><identifier>EISSN: 1361-6463</identifier><identifier>DOI: 10.1088/0022-3727/37/18/019</identifier><identifier>CODEN: JPAPBE</identifier><language>eng</language><publisher>Bristol: IOP Publishing</publisher><subject>Applied sciences ; Electronics ; Exact sciences and technology ; Optoelectronic devices ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><ispartof>Journal of physics. D, Applied physics, 2004-09, Vol.37 (18), p.2618-2622</ispartof><rights>2004 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c382t-995d4604acef094edd4973a3b16f7c87d57a4cd950bdbf397dc4ef6f6b711bdc3</citedby><cites>FETCH-LOGICAL-c382t-995d4604acef094edd4973a3b16f7c87d57a4cd950bdbf397dc4ef6f6b711bdc3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=16110003$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Xu, M S</creatorcontrib><creatorcontrib>Xu, J B</creatorcontrib><creatorcontrib>Chen, H Z</creatorcontrib><creatorcontrib>Wang, M</creatorcontrib><title>Nanoscale investigation of moisture-induced degradation mechanisms of tris(8-hydroxyquinoline) aluminium-based organic light-emitting diodes</title><title>Journal of physics. D, Applied physics</title><description>By exploiting tapping mode atomic force microscopy, the moisture-induced degradation mechanisms of ITO (indium tin oxide)-coated glass/CuPc (copper phthalocyanine)/NPB (N, N'-di(naphthalene-1-yl)-N, N'-diphthalbenzidine)/Alq3 (tris(8-hydroxyquinoline) aluminium)-based organic light-emitting diodes without cathode were investigated. It is found that three types of degradation mechanisms are associated with moisture-exposed Alq3 films, when the device is exposed to moisture, namely, hydration of Alq3, crystallization of Alq3 and reaction of the Alq3 complex with H2O. Crystallization of the NPB layer of ITO/CuPc/NPB was observed on exposure to moisture, and de-wetting simultaneously takes place at the interface of CuPc/NPB. Indium and/or oxygen may diffuse from ITO into the organic layers. These observations provide a clear picture of the moisture-induced degradation mechanisms of the ITO/CuPc/NPB/Alq3-based OLEDs.</description><subject>Applied sciences</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Optoelectronic devices</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><issn>0022-3727</issn><issn>1361-6463</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2004</creationdate><recordtype>article</recordtype><recordid>eNqNkMtq3DAUhkVoINO0T9CNNw1NQBnJ8kjWMoT0AiHZJGsh6-I5xZYmkh0y75CHrsyEdtEuujmHg77_B30IfaLkkpK2XRNS15iJWqyZWNNyU3mEVpRxinnD2Tu0-k2coPc5_ySEbHhLV-j1ToeYjR5cBeHZ5Ql6PUEMVfTVGCFPc3IYgp2Ns5V1fdL28D46s9UB8pgXdEqQv7R4u7cpvuyfZghxgODOKz3MIwSYR9zpXCpi6kvKVAP02wm7EaYJQl9ZiNblD-jY6yG7j2_7FD1-vXm4_o5v77_9uL66xYa19YSl3NiGk0Yb54lsnLWNFEyzjnIvTCvsRujGWLkhne08k8KaxnnueSco7axhp-js0LtL8Wkun1YjZOOGQQcX56xq2dSMMFlAdgBNijkn59UuwajTXlGiFvNq8aoWr2UoWm66pD6_1evFrE86GMh_opzS4p8V7vLAQdz9Z_HF34F_gGpnPfsF9GijAw</recordid><startdate>20040921</startdate><enddate>20040921</enddate><creator>Xu, M S</creator><creator>Xu, J B</creator><creator>Chen, H Z</creator><creator>Wang, M</creator><general>IOP Publishing</general><general>Institute of Physics</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20040921</creationdate><title>Nanoscale investigation of moisture-induced degradation mechanisms of tris(8-hydroxyquinoline) aluminium-based organic light-emitting diodes</title><author>Xu, M S ; Xu, J B ; Chen, H Z ; Wang, M</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c382t-995d4604acef094edd4973a3b16f7c87d57a4cd950bdbf397dc4ef6f6b711bdc3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2004</creationdate><topic>Applied sciences</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Optoelectronic devices</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Xu, M S</creatorcontrib><creatorcontrib>Xu, J B</creatorcontrib><creatorcontrib>Chen, H Z</creatorcontrib><creatorcontrib>Wang, M</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of physics. D, Applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Xu, M S</au><au>Xu, J B</au><au>Chen, H Z</au><au>Wang, M</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Nanoscale investigation of moisture-induced degradation mechanisms of tris(8-hydroxyquinoline) aluminium-based organic light-emitting diodes</atitle><jtitle>Journal of physics. D, Applied physics</jtitle><date>2004-09-21</date><risdate>2004</risdate><volume>37</volume><issue>18</issue><spage>2618</spage><epage>2622</epage><pages>2618-2622</pages><issn>0022-3727</issn><eissn>1361-6463</eissn><coden>JPAPBE</coden><abstract>By exploiting tapping mode atomic force microscopy, the moisture-induced degradation mechanisms of ITO (indium tin oxide)-coated glass/CuPc (copper phthalocyanine)/NPB (N, N'-di(naphthalene-1-yl)-N, N'-diphthalbenzidine)/Alq3 (tris(8-hydroxyquinoline) aluminium)-based organic light-emitting diodes without cathode were investigated. It is found that three types of degradation mechanisms are associated with moisture-exposed Alq3 films, when the device is exposed to moisture, namely, hydration of Alq3, crystallization of Alq3 and reaction of the Alq3 complex with H2O. Crystallization of the NPB layer of ITO/CuPc/NPB was observed on exposure to moisture, and de-wetting simultaneously takes place at the interface of CuPc/NPB. Indium and/or oxygen may diffuse from ITO into the organic layers. These observations provide a clear picture of the moisture-induced degradation mechanisms of the ITO/CuPc/NPB/Alq3-based OLEDs.</abstract><cop>Bristol</cop><pub>IOP Publishing</pub><doi>10.1088/0022-3727/37/18/019</doi><tpages>5</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0022-3727
ispartof Journal of physics. D, Applied physics, 2004-09, Vol.37 (18), p.2618-2622
issn 0022-3727
1361-6463
language eng
recordid cdi_proquest_miscellaneous_29423039
source Institute of Physics:Jisc Collections:IOP Publishing Read and Publish 2024-2025 (Reading List)
subjects Applied sciences
Electronics
Exact sciences and technology
Optoelectronic devices
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
title Nanoscale investigation of moisture-induced degradation mechanisms of tris(8-hydroxyquinoline) aluminium-based organic light-emitting diodes
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-12T14%3A59%3A09IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Nanoscale%20investigation%20of%20moisture-induced%20degradation%20mechanisms%20of%20tris(8-hydroxyquinoline)%20aluminium-based%20organic%20light-emitting%20diodes&rft.jtitle=Journal%20of%20physics.%20D,%20Applied%20physics&rft.au=Xu,%20M%20S&rft.date=2004-09-21&rft.volume=37&rft.issue=18&rft.spage=2618&rft.epage=2622&rft.pages=2618-2622&rft.issn=0022-3727&rft.eissn=1361-6463&rft.coden=JPAPBE&rft_id=info:doi/10.1088/0022-3727/37/18/019&rft_dat=%3Cproquest_cross%3E29423039%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c382t-995d4604acef094edd4973a3b16f7c87d57a4cd950bdbf397dc4ef6f6b711bdc3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=29423039&rft_id=info:pmid/&rfr_iscdi=true