Synchrotron radiation FT-IR micro-spectroscopy of fluorophlogopite in the O–H stretching region

Synchrotron radiation FT-IR polarized micro-spectroscopy has been used to investigate the natural mica fluorophlogopite in order to characterize the stretching vibrations of the OH groups and their orientation relative to the mica cleavage (0 0 1) plane. A procedure to eliminate undesired interferen...

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Bibliographic Details
Published in:Vibrational spectroscopy 2006-10, Vol.42 (1), p.59-62
Main Authors: Piccinini, M., Cibin, G., Marcelli, A., Ventura, G. Della, Bellatreccia, F., Mottana, A.
Format: Article
Language:English
Subjects:
Infrared
Mica
Microscopy
Phyllosilicates
Synchrotron radiation
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Summary:Synchrotron radiation FT-IR polarized micro-spectroscopy has been used to investigate the natural mica fluorophlogopite in order to characterize the stretching vibrations of the OH groups and their orientation relative to the mica cleavage (0 0 1) plane. A procedure to eliminate undesired interference fringes, typically observed when working with thin single-crystals, was set up using an ad hoc sample preparation, and tested. The naturally high brilliance and high polarization properties of synchrotron radiation allows to study very small flakes and hence offers new analytical possibilities in comparison to conventional powder FT-IR spectroscopy.
ISSN:0924-2031
1873-3697
DOI:10.1016/j.vibspec.2006.04.010