Loading…

Complex impedance analysis of NaLaTiO4 electroceramics

A layered perovskite type ceramic oxide, NaLaTiO^sub 4^, has been prepared by a standard high temperature solid-state reaction route. Material formation has been confirmed by x-ray diffraction (XRD) studies. Complex impedance analysis on this system has been carried out, to investigate its electrica...

Full description

Saved in:
Bibliographic Details
Published in:Journal of materials science. Materials in electronics 2006-03, Vol.17 (3), p.157-164
Main Authors: PRADHAN, Dillip K, SAMANTARAY, B. K, CHOUDHARY, R. N. P, THAKUR, Awalendra K
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c364t-2023d1133032ce109e4a1833094ac730f47c01c13d5c50eb4a30143b3592c0be3
cites cdi_FETCH-LOGICAL-c364t-2023d1133032ce109e4a1833094ac730f47c01c13d5c50eb4a30143b3592c0be3
container_end_page 164
container_issue 3
container_start_page 157
container_title Journal of materials science. Materials in electronics
container_volume 17
creator PRADHAN, Dillip K
SAMANTARAY, B. K
CHOUDHARY, R. N. P
THAKUR, Awalendra K
description A layered perovskite type ceramic oxide, NaLaTiO^sub 4^, has been prepared by a standard high temperature solid-state reaction route. Material formation has been confirmed by x-ray diffraction (XRD) studies. Complex impedance analysis on this system has been carried out, to investigate its electrical properties in details. The impedance analysis results have indicated the electrical conduction process to be governed by the contribution of both the grain (bulk) and grain boundaries above a temperature of 350 ^sup ^C with typical negative temperature coefficient of resistance (NTCR) type behaviour like that of a semiconductor. The d. c. conductivity of the material as evaluated from the impedance analysis has been observed to be of the order of 10^sup -9^ Scm^sup -1^ at room temperature and 10^sup -6^ Scm^sup -1^ at 500 ^sup ^C. The conductivity variation shows a cross over from Mott-type hopping behaviour at lower temperatures to a thermally activated Arrhenius behaviour at higher temperatures.[PUBLICATION ABSTRACT]
doi_str_mv 10.1007/s10854-006-6756-0
format article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_29501805</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>28919259</sourcerecordid><originalsourceid>FETCH-LOGICAL-c364t-2023d1133032ce109e4a1833094ac730f47c01c13d5c50eb4a30143b3592c0be3</originalsourceid><addsrcrecordid>eNqFkE1LAzEURYMoWKs_wN0g6G70vbxkkiyl-AXFbiq4C2magSkznTFpwf57U1oQ3Lh6XDj3wjuMXSPcI4B6SAhaihKgKislqxJO2AilolJo_nnKRmCkKoXk_JxdpLSCDArSI1ZN-m5ow3fRdENYurUPhVu7dpeaVPR18e6mbt7MRBHa4Dex9yG6rvHpkp3Vrk3h6njH7OP5aT55Laezl7fJ47T0VIlNyYHTEpEIiPuAYIJwqHM0wnlFUAvlAT3SUnoJYSEcAQpakDTcwyLQmN0ddofYf21D2tiuST60rVuHfpssNxJQg_wf1AYNlyaDN3_AVb-N-eVktRZaaRQqQ3iAfOxTiqG2Q2w6F3cWwe5924NvmzXavW8LuXN7HHbJu7aOWWaTfouqUoYU0Q8Ar3z-</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>884878147</pqid></control><display><type>article</type><title>Complex impedance analysis of NaLaTiO4 electroceramics</title><source>Springer Nature</source><creator>PRADHAN, Dillip K ; SAMANTARAY, B. K ; CHOUDHARY, R. N. P ; THAKUR, Awalendra K</creator><creatorcontrib>PRADHAN, Dillip K ; SAMANTARAY, B. K ; CHOUDHARY, R. N. P ; THAKUR, Awalendra K</creatorcontrib><description>A layered perovskite type ceramic oxide, NaLaTiO^sub 4^, has been prepared by a standard high temperature solid-state reaction route. Material formation has been confirmed by x-ray diffraction (XRD) studies. Complex impedance analysis on this system has been carried out, to investigate its electrical properties in details. The impedance analysis results have indicated the electrical conduction process to be governed by the contribution of both the grain (bulk) and grain boundaries above a temperature of 350 ^sup ^C with typical negative temperature coefficient of resistance (NTCR) type behaviour like that of a semiconductor. The d. c. conductivity of the material as evaluated from the impedance analysis has been observed to be of the order of 10^sup -9^ Scm^sup -1^ at room temperature and 10^sup -6^ Scm^sup -1^ at 500 ^sup ^C. The conductivity variation shows a cross over from Mott-type hopping behaviour at lower temperatures to a thermally activated Arrhenius behaviour at higher temperatures.[PUBLICATION ABSTRACT]</description><identifier>ISSN: 0957-4522</identifier><identifier>EISSN: 1573-482X</identifier><identifier>DOI: 10.1007/s10854-006-6756-0</identifier><language>eng</language><publisher>Norwell, MA: Springer</publisher><subject>Applied sciences ; Electronics ; Exact sciences and technology ; Materials ; Microelectronics ; Studies ; Temperature</subject><ispartof>Journal of materials science. Materials in electronics, 2006-03, Vol.17 (3), p.157-164</ispartof><rights>2006 INIST-CNRS</rights><rights>Springer Science + Business Media, Inc. 2006</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c364t-2023d1133032ce109e4a1833094ac730f47c01c13d5c50eb4a30143b3592c0be3</citedby><cites>FETCH-LOGICAL-c364t-2023d1133032ce109e4a1833094ac730f47c01c13d5c50eb4a30143b3592c0be3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,778,782,27911,27912</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=17679373$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>PRADHAN, Dillip K</creatorcontrib><creatorcontrib>SAMANTARAY, B. K</creatorcontrib><creatorcontrib>CHOUDHARY, R. N. P</creatorcontrib><creatorcontrib>THAKUR, Awalendra K</creatorcontrib><title>Complex impedance analysis of NaLaTiO4 electroceramics</title><title>Journal of materials science. Materials in electronics</title><description>A layered perovskite type ceramic oxide, NaLaTiO^sub 4^, has been prepared by a standard high temperature solid-state reaction route. Material formation has been confirmed by x-ray diffraction (XRD) studies. Complex impedance analysis on this system has been carried out, to investigate its electrical properties in details. The impedance analysis results have indicated the electrical conduction process to be governed by the contribution of both the grain (bulk) and grain boundaries above a temperature of 350 ^sup ^C with typical negative temperature coefficient of resistance (NTCR) type behaviour like that of a semiconductor. The d. c. conductivity of the material as evaluated from the impedance analysis has been observed to be of the order of 10^sup -9^ Scm^sup -1^ at room temperature and 10^sup -6^ Scm^sup -1^ at 500 ^sup ^C. The conductivity variation shows a cross over from Mott-type hopping behaviour at lower temperatures to a thermally activated Arrhenius behaviour at higher temperatures.[PUBLICATION ABSTRACT]</description><subject>Applied sciences</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Materials</subject><subject>Microelectronics</subject><subject>Studies</subject><subject>Temperature</subject><issn>0957-4522</issn><issn>1573-482X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><recordid>eNqFkE1LAzEURYMoWKs_wN0g6G70vbxkkiyl-AXFbiq4C2magSkznTFpwf57U1oQ3Lh6XDj3wjuMXSPcI4B6SAhaihKgKislqxJO2AilolJo_nnKRmCkKoXk_JxdpLSCDArSI1ZN-m5ow3fRdENYurUPhVu7dpeaVPR18e6mbt7MRBHa4Dex9yG6rvHpkp3Vrk3h6njH7OP5aT55Laezl7fJ47T0VIlNyYHTEpEIiPuAYIJwqHM0wnlFUAvlAT3SUnoJYSEcAQpakDTcwyLQmN0ddofYf21D2tiuST60rVuHfpssNxJQg_wf1AYNlyaDN3_AVb-N-eVktRZaaRQqQ3iAfOxTiqG2Q2w6F3cWwe5924NvmzXavW8LuXN7HHbJu7aOWWaTfouqUoYU0Q8Ar3z-</recordid><startdate>20060301</startdate><enddate>20060301</enddate><creator>PRADHAN, Dillip K</creator><creator>SAMANTARAY, B. K</creator><creator>CHOUDHARY, R. N. P</creator><creator>THAKUR, Awalendra K</creator><general>Springer</general><general>Springer Nature B.V</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>F28</scope><scope>FR3</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>KB.</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>S0W</scope></search><sort><creationdate>20060301</creationdate><title>Complex impedance analysis of NaLaTiO4 electroceramics</title><author>PRADHAN, Dillip K ; SAMANTARAY, B. K ; CHOUDHARY, R. N. P ; THAKUR, Awalendra K</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c364t-2023d1133032ce109e4a1833094ac730f47c01c13d5c50eb4a30143b3592c0be3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2006</creationdate><topic>Applied sciences</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Materials</topic><topic>Microelectronics</topic><topic>Studies</topic><topic>Temperature</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>PRADHAN, Dillip K</creatorcontrib><creatorcontrib>SAMANTARAY, B. K</creatorcontrib><creatorcontrib>CHOUDHARY, R. N. P</creatorcontrib><creatorcontrib>THAKUR, Awalendra K</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>Materials Science Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>DELNET Engineering &amp; Technology Collection</collection><jtitle>Journal of materials science. Materials in electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>PRADHAN, Dillip K</au><au>SAMANTARAY, B. K</au><au>CHOUDHARY, R. N. P</au><au>THAKUR, Awalendra K</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Complex impedance analysis of NaLaTiO4 electroceramics</atitle><jtitle>Journal of materials science. Materials in electronics</jtitle><date>2006-03-01</date><risdate>2006</risdate><volume>17</volume><issue>3</issue><spage>157</spage><epage>164</epage><pages>157-164</pages><issn>0957-4522</issn><eissn>1573-482X</eissn><abstract>A layered perovskite type ceramic oxide, NaLaTiO^sub 4^, has been prepared by a standard high temperature solid-state reaction route. Material formation has been confirmed by x-ray diffraction (XRD) studies. Complex impedance analysis on this system has been carried out, to investigate its electrical properties in details. The impedance analysis results have indicated the electrical conduction process to be governed by the contribution of both the grain (bulk) and grain boundaries above a temperature of 350 ^sup ^C with typical negative temperature coefficient of resistance (NTCR) type behaviour like that of a semiconductor. The d. c. conductivity of the material as evaluated from the impedance analysis has been observed to be of the order of 10^sup -9^ Scm^sup -1^ at room temperature and 10^sup -6^ Scm^sup -1^ at 500 ^sup ^C. The conductivity variation shows a cross over from Mott-type hopping behaviour at lower temperatures to a thermally activated Arrhenius behaviour at higher temperatures.[PUBLICATION ABSTRACT]</abstract><cop>Norwell, MA</cop><pub>Springer</pub><doi>10.1007/s10854-006-6756-0</doi><tpages>8</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0957-4522
ispartof Journal of materials science. Materials in electronics, 2006-03, Vol.17 (3), p.157-164
issn 0957-4522
1573-482X
language eng
recordid cdi_proquest_miscellaneous_29501805
source Springer Nature
subjects Applied sciences
Electronics
Exact sciences and technology
Materials
Microelectronics
Studies
Temperature
title Complex impedance analysis of NaLaTiO4 electroceramics
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T16%3A17%3A15IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Complex%20impedance%20analysis%20of%20NaLaTiO4%20electroceramics&rft.jtitle=Journal%20of%20materials%20science.%20Materials%20in%20electronics&rft.au=PRADHAN,%20Dillip%20K&rft.date=2006-03-01&rft.volume=17&rft.issue=3&rft.spage=157&rft.epage=164&rft.pages=157-164&rft.issn=0957-4522&rft.eissn=1573-482X&rft_id=info:doi/10.1007/s10854-006-6756-0&rft_dat=%3Cproquest_cross%3E28919259%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c364t-2023d1133032ce109e4a1833094ac730f47c01c13d5c50eb4a30143b3592c0be3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=884878147&rft_id=info:pmid/&rfr_iscdi=true