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X-ray powder diffraction refinement of Ag2In2SiSe6 structure and phase diagram of the AgInSe2-SiSe2 system

The phase diagram of the AgInSe2-SiSe2 system was investigated using the results of differential thermal analysis and X-ray diffraction. The existence of a new quaternary phase, Ag2In2SiSe6, was discovered in the system; it melts congruently at 1100 K and has a polymorphous transition at 1040K. The...

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Bibliographic Details
Published in:Journal of alloys and compounds 2006-04, Vol.414 (1-2), p.73-77
Main Authors: OLEKSEYUK, I. D, SACHANYUK, V. P, PARASYUK, O. V
Format: Article
Language:English
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Summary:The phase diagram of the AgInSe2-SiSe2 system was investigated using the results of differential thermal analysis and X-ray diffraction. The existence of a new quaternary phase, Ag2In2SiSe6, was discovered in the system; it melts congruently at 1100 K and has a polymorphous transition at 1040K. The crystal structure of the low-temperature (LT) modification of this phase was investigated using powder X-ray diffraction. Ag2In2SiSe6 crystallizes in a monoclinic structure, space group (S.G.) Cc (structural type Ag2In2GeSe6), with lattice parameters a = 1.26683(4) nm, b = 0.74565(3) nm, c = 1.26133(4) run and beta = 109.286(2) deg . The atomic parameters were refined in the isotropic approximation to R(I) = 0.0758 and R(P) = 0.1096.
ISSN:0925-8388
1873-4669
DOI:10.1016/j.jallcom.2005.07.025