Probe temperature and output voltage calculation for the SThM in A.C. mode

This study concerns the hot wire thermal microscope running in A.C. mode with given electrical current intensity. The resultant output voltage constitutes the measure. Writing the Fourier equation for the probe temperature at different frequencies T( x, ω), we obtain a linear differential system wit...

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Bibliographic Details
Published in:Superlattices and microstructures 2004-03, Vol.35 (3), p.269-282
Main Authors: Depasse, F., Grossel, Ph, Trannoy, N.
Format: Article
Language:English
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Summary:This study concerns the hot wire thermal microscope running in A.C. mode with given electrical current intensity. The resultant output voltage constitutes the measure. Writing the Fourier equation for the probe temperature at different frequencies T( x, ω), we obtain a linear differential system with constant coefficients, the general solution of which can be written depending on the eigenvalues of the system matrix. The bounding conditions (heat exchange at sample and Wollaston contact at different frequencies) lead to the wanted particular solution. From the x-mean temperature we deduce the probe electric resistance and the A.C. output voltage. Results show the SThM sensitivity variations depending on the sample nature and on the electric current frequency.
ISSN:0749-6036
1096-3677
DOI:10.1016/j.spmi.2004.01.008