Cracking of low temperature solution deposited CeO2 thin films

• Published in: Journal of electroceramics 2006-07, Vol.16 (4), p.575-579
• Main Authors: GOH, Gregory K. L, TAY, Christine S. S, CHAN, Kelvin Y. S, GOSVAMI, N
• Format: Article
• Language: English
• Subjects: Aqueous solutions; Condensed matter: structure, mechanical and thermal properties; Cross-disciplinary physics: materials science; rheology; Exact sciences and technology; Liquid phase epitaxy; deposition from liquid phases (melts, solutions, and surface layers on liquids); Materials science; Mechanical and acoustical properties; Methods of deposition of films and coatings; film growth and epitaxy; Physical properties of thin films, nonelectronic; Physics; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Thin films
• ISSN: 1385-3449; 1573-8663
• DOI: 10.1007/s10832-006-9922-0

Issue Title: Special Issue: Symposium on Functional Ceramic Materials and Thin Films of ICMAT 2005: Part I July 2006 Crystalline CeO^sub 2^ films grown in aqueous solutions at 45^sup ^C on glass slides formed by the island growth mode. The film had a refractive index of 1.83 and indicated that the film had a porosity of 41.3%, which significantly lowered the elastic stiffness of the film. The film cracked only after drying in a mud crack pattern when it reached a critical thickness. This indicated that the film cracked under tensile stress due to the accumulation of tensile strains generated from grain coalescence during growth, thermal expansion mismatch during cooling and capillary stress during drying.[PUBLICATION ABSTRACT]