Nondestructive discrimination of small glass fragments for forensic examination using high energy synchrotron radiation x-ray fluorescence spectrometry

This paper demonstrates that high‐energy SR‐XRF (synchrotron radiation x‐ray fluorescence spectrometry) utilizing 116 keV x‐rays is a powerful technique for nondestructive discrimination of small glass fragments. An XRF spectrum of glass fragments of a standard material SRM612 gave well‐resolved K‐l...

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Bibliographic Details
Published in:X-ray spectrometry 2006-05, Vol.35 (3), p.195-199
Main Authors: Nishiwaki, Yoshinori, Nakanishi, Toshio, Terada, Yasuko, Ninomiya, Toshio, Nakai, Izumi
Format: Article
Language:English
Subjects:
Analytical chemistry
Chemistry
Exact sciences and technology
Spectrometric and optical methods
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Summary:This paper demonstrates that high‐energy SR‐XRF (synchrotron radiation x‐ray fluorescence spectrometry) utilizing 116 keV x‐rays is a powerful technique for nondestructive discrimination of small glass fragments. An XRF spectrum of glass fragments of a standard material SRM612 gave well‐resolved K‐line peaks of 34 elements, including the rare‐earth elements. The relative standard deviations (RSD) of the ratios of the intensities of heavy elements normalized by that of Ba were less than 8.2% for the analyses of 10 fragments (
ISSN:0049-8246
1097-4539
DOI:10.1002/xrs.895